International Business Machines Corporation

Thomas St Pierre

Michael Richard Ouellette

Tad Jeffrey Wilder

Carl Frederick Barnhart

Leonard O Farnsworth, Iii

Michael Z Felske

Benjamin P Lynch

Norbert Hagspiel

Pamela Sue Gillis

Thomas Fuchs

Jörg-Stephan Vogt

Pamela S Gillia

A sort device includes a compare unit on one level of a hierarchical structure that includes a plurality of levels. The compare unit to compare one beat of one record with another beat of another record to provide a winner beat. The sort device further includes another compare unit on another level of the hierarchical structure to provide a further beat to the compare unit, and a request pipe to be used to request that the other compare unit provide the further beat to the compare unit.

Hierarchical sort/merge structure using a request pipe

An integrated circuit and method of testing and repairing the integrated circuit. The integrated circuit includes: a multiplicity of macro-circuits having the same function; a fuse bank, the state of the fuses storing test data indicating at least which macro-circuits failed a test; and means for preventing utilization of failing macro-circuits during operation of the integrated circuit and a method generating a partial good integrated circuit, the method including: providing an integrated circuit have a multiplicity of macro-circuits arranged in one or more groups, each macro-circuit having the same function and a fuse bank containing fuses; testing each macro-circuit prior to a fuse programming operation; programming the fuses in the fuse bank in order to store data indicating at least which macro-circuits failed the testing step; and preventing utilization of each failing macro-circuit during operation of the integrated based on the data stored in the fuse bank.

Partial good integrated circuit and method of testing same

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Forstinning, Germany

Thomas St Pierre