Robert Boschgmbh

Thomas Seiffert

Thomas Brinz

Matthias Fleischer

Rui Ding

Andreas Schumacher

An interferometric system for measuring a measured object, having an arrangement for generating a measuring beam path, measuring beams being directed at the measured object, having an arrangement for generating a reference beam path, reference beams being directed to a reference element, having an adjusting arrangement for adjusting a path difference between the measuring beams and the reference beams, and a having a detector for recording images of the superposition of the reference beams and the measuring beams reflected by the measured object. According to the present system, a synchronization arrangement is used to control the adjusting arrangement so that the path difference between the measuring beams and the reference beams is adjusted in synchronization with the images recorded by the detector. The present system also relates to a method for adjusting a path difference.

Interferometric system and method for adjusting a path difference

A device for optical characterization of a sample is provided, the sample being accommodated in a receptacle container transparent to light. The device includes a camera, using which the sample may be detected, and a first light source is situated in such a way that the sample is transilluminated opposite to the viewing direction of the camera, a second light source is situated on the same side as the camera, and a laser source is situated transversely to the viewing direction of the camera.

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Gerlingen, Germany

Thomas Seiffert