Rohde and Schwarz Gmbh & Co. Kg

University of Basel

Thomas Ruster

Baris Guezelarslan

Melvyn Ho

Philipp Treutlein

Yongqi Shi

Thomas Winkler

Ryanne Leong

Miguel Bueno Diez

Miguel Buenodiez

Paul Renardy

The present disclosure relates to a sensor system for analyzing a spectrum of an electromagnetic, EM, signal. The system includes a vapor cell containing at least one species of atoms in a gaseous form, wherein the atoms in the vapor cell are exposed to the EM signal; at least one excitation source excites a number of atoms in the vapor cell to a Rydberg state, wherein at least a fraction of the excited atoms are ionized; a number of electrode pairs which are arranged along the vapor cell, and which generate a spatially and/or temporally varying electric field in the vapor cell; a current sense circuit detects a current between at least one of the number of electrode pairs, wherein the current is caused by ionized atoms in the vapor cell; and a processor determines spectral information of the EM signal based on the detected current.

Sensor system and method for analyzing a spectrum of an EM signal

A sensor system for sensing EM radiation and a method for calibrating the system are provided. The system includes a sensing element that receives calibration signals or signal components with different frequencies. Recording device records responses of the sensing element to at least two calibration signals or signal components. A respective response to a calibration signal of the at least two calibration signals or signal components depends on an excitation of one or more of the resonances by the calibration signal. A part of the recorded responses to and/or information derived from at least a part of the recorded responses is stored in a model which correlates the responses to frequencies and/or signal levels of the corresponding calibration signals or signal components. Processor uses the model to convert a response of the sensing element to an EM signal to be analyzed into a frequency spectrum of the EM signal.

Sensor system and method for calibrating a sensor system

Disclosed is a measurement system for analysing RF signals. The measurement system includes an optically transparent enclosure including an optically pumpable gas, and a printed circuit board, PCB including an electrical transmission line for guiding the RF signal to be analyzed through the enclosure and a reflective planar face. The measurement system includes an optical pump for emitting preferably coherent light onto the reflective planar face, and a detector for detecting an optical property of the emitted light being reflected by the reflective planar face. This provides a better laser/microwave overlap in atomic vapor quantum sensing setups, where it is crucial to overlap the regions with highest laser intensity and microwave field strength.

Measurement system for analysing radio frequency signals, and method of operating the same

Disclosed is a measurement system for analyzing RF signals, comprising an optically transparent enclosure including an optically pumpable medium being exposed to an electromagnetic field of the RF signal to be analyzed; an optical pump for penetrating the medium with intensity-modulated light, the intensity defining an absorption sensitivity of the medium; a field generator for generating an electric and/or magnetic field within the enclosure, a strength of the generated field defining an absorption frequency of the medium; a controller for controlling the absorption sensitivity of the medium in dependence of the absorption frequency of the medium; and a detector for detecting an optical property of the penetrating light passing through the medium. This facilitates fine-tunable and frequency-dependent control of sensitivity and dynamic range for spectral analysis of RF signals.

Measurement system and method for analyzing RF signals

The inventive system for analyzing electromagnetic radiation comprises: an enclosure filled with gas containing atoms of a known type, at least one light source emitting light capable of exciting the atoms of the known type in the gas, a source of the electromagnetic radiation to be analyzed arranged such that the emitted electromagnetic radiation acts on the atoms of the known type in the gas, and a sensor for capturing light emitted by and/or passed through the gas. Further, the system comprises an electrical field source and/or magnetic field source configured to establish a predefined electrical field and/or magnetic field acting on the atoms of the known type in the gas. The light captured by the sensor reflects a response of the atoms of the known type in the gas on the electrical field and/or the magnetic fields, the light from the at least one light source, and the electromagnetic radiation to be analyzed.

System for analyzing electromagnetic radiation

A system for measuring electromagnetic radiation, including at least one light source; a quantum converter arranged to be exposed to radiation emitted by the at least one light source and the electromagnetic radiation, and at least one detector for detecting optical radiation received from the quantum converter. The quantum converter includes at least a first interaction zone and a second interaction zone, and the system establishes at least a first light beam path for exposing the first interaction zone and a second light beam path for exposing the second interaction zone with radiation emitted by the at least one light source. Each laser beam path is controllable to be in an activated state enabling exposure and in a deactivated state preventing exposure of the respective interaction zone.

Alternation pulsed double resonance detection scheme for gapless detection in atomic vapor quantum sensors

The invention relates to a system in particular a quantum sensor system, for testing a device-under-test, DUT, comprising: an optically excitable medium which is arranged to receive electromagnetic, EM, radiation emitted by the DUT, at least one light source configured to irradiate the medium with at least one light beam, wherein the medium is optically excited by the at least one light beam, a field generator unit configured to generate an electric and/or magnetic field within the medium, wherein a resonance frequency of the excited medium is modified by an amplitude of the electric and/or magnetic field, wherein an optical parameter, in particular a luminescence, of the exited medium is locally modified if a frequency of the EM radiation corresponds to the resonance frequency at a position in the medium, an image detector configured to acquire an image of the medium, wherein the image shows an intensity profile that results from the modification of the optical parameter, a processor configured to analyze the DUT based on the acquired image.

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Munich, Germany

Thomas Ruster