X-rite Gmbh

Thomas Richardson

Jon Nisper

Richard John Van Andel

David Salyer

Christian Boes

David Bosscher

Patrick S Rood

Brett Allen Pawlanta

Brian Dale Teunis

James L Overbeck

Michael J Weber

Marc S Ellens

Changbo Huang

A hyperspectral imaging spectrophotometer and system, with calibration, data collection, and image processing methods designed to match human visual perception and color matching of complex colored objects.

Hyperspectral imaging spectrophotometer and system

An apparatus for measuring a spatially under-sampled Bidirectional Reflectance Distribution Function (BRDF) of a surface. The apparatus may comprise a first light source directed to illuminate the surface from a first illumination direction, and a plurality of sensors positioned to receive light reflected by the surface. The plurality of sensors may comprise first, second and third sensors positioned to receive light reflected by the surface in first, second and third non-coplanar directions. In various embodiments, the apparatus may also comprise a computer in communication with the plurality of sensors. The computer is configured to convert light sensed by the plurality of sensors into a first appearance property of the surface considering the first, second, and third reflectance directions. A method of calculating xDNA, the vector sum of the observed reflectance intensity over a plurality of wavelengths and angles. Methods of using the calculated xDNA for formulating recipes for a surfaces colors. Furthermore, a method for using the calculated xDNA for rendering the surface color.

Method and system for enhanced formulation and visualization rendering

Computer-implemented systems and methods for processing image data of a process-free plate are provided according to the present disclosure. The systems and methods may, generally, include a data acquisition step/means for receiving image data using one or more channels of a imaging system, each channel functioning to image the same target region of a process-free plate using a different wavelength of light, and a data processing step/means for filtering the image data using at least one of: (i) self-filtering, (ii) Fourier shrinkage and (iii) Wavelet shrinkage. When the image data is received using a plurality of channels, the received image data may advantageously be combined so as to optimize contrast-to-noise performance. The disclosed systems and methods may advantageously perform the operations of image de-noising, contrast enhancement, and thresholding, and may further involve compensation techniques, e.g., for minimizing distortion and blurring effects.

Systems and method for optical scatter imaging of latent image plates

An apparatus for measuring a spatially under-sampled Bidirectional Reflectance Distribution Function (BRDF) of a surface. The apparatus may comprise a first light source directed to illuminate the surface from a first illumination direction, and a plurality of sensors positioned to receive light reflected by the surface. The plurality of sensors may comprise first, second and third sensors positioned to receive light reflected by the surface in first, second and third non-coplanar directions. In various embodiments, the apparatus may also comprise a computer in communication with the plurality of sensors. The computer is configured to convert light sensed by the plurality of sensors into a first appearance property of the surface considering the first, second, and third reflectance directions.

Measuring an appearance property of a surface using a bidirectional reflectance distribution function

Measuring an appearance property of a surface using a spatially under-sampled bidirectional reflectance distribution function

A method for monitoring a process output with a highly abridged spectrophotometer. The method includes securing spectral data for each spectral primary used in a process, measuring spectral data with a highly abridged spectrophotometer for a sample produced by the process, determining an estimated weight for each spectral primary in the sample, and computing spectral data representative of the sample based on the secured spectral data and the determined estimated weight for each spectral primary in the sample.

Systems and methods for monitoring a process output with a highly abridged spectrophotometer

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Ada, MI, United States of America

Thomas Richardson