Qualcomm Incorporated

Motorola Corporation

International Business Machines Corporation

Thomas R Toms

Shiqun Gu

Matthew Michael Nowak

Jonghae Kim

Brian Matthew Henderson

Lew G Chua-Eoan

Chunlei Shi

Boris Andreev

Justin Joseph Rosen Gagne

Seyfollah Seyfollahi Bazarjani

Clinton C Kuo

James B Eifert

Seung Hyuk Kang

Robert Paul Masleid

Jung Pill Kim

Jungwon Suh

Seong-Ook Jung

Hari Rao

Gary L Miller

John Beck

Reza Jalilizeinali

Christopher Cooper Riddle

Thomas Jew

Vivek Mohan

Wallace B Harwood, Iii

Vernon B Goler

Joseph Jelemensky

Sreeker Dundigal

Mark R Heene

Mark S Weidner

Ann E Harwood

Cheri L Harrington

Hubert G Carson, Jr

Yoshiko K Inoue

Yongliang Wang

Kishna Weaver

Lew G Choa-Eoan

Wallace B Hardwood, Iii

Ivan James Fontenot

Christopher C c/o Qualcomm Incorporated Riddle

A system and method to initiate a housekeeping operation at a mobile device is disclosed. In a particular embodiment, a method at a mobile device includes modifying a scheduled housekeeping operation in response to determining that the mobile device is in a charging mode.

System and method to initiate a housekeeping operation at a mobile device

Thermal conductivity in a stacked IC device can be improved by constructing one or more active temperature control devices within the stacked IC device. In one embodiment, the control devices are thermal electric (TE) devices, such as Peltier devices. The TE devices can then be selectively controlled to remove or add heat, as necessary, to maintain the stacked IC device within a defined temperature range. The active temperature control elements can be P-N junctions created in the stacked IC device and can serve to move the heat laterally and/or vertically, as desired.

Active thermal control for stacked IC devices

The cost associated with alignment in a stacked IC device can be reduced by aligning multiple die instead of a single die during the alignment step. In one embodiment, the alignment structures are placed in the scribe line instead of within the die itself. Aligning four die instead of one eliminates the need for as many alignment indicators and thus more silicon on the wafer can be used for active areas. In addition, this method allows for yield improvement through binning of dies having the same yield configuration.

Low cost die-to-wafer alignment/bond for 3d IC stacking

A three dimensional on-chip radio frequency amplifier is disclosed that includes first and second transformers and a first transistor. The first transformer includes first and second inductively coupled inductors. The second transformer includes third and fourth inductively coupled inductors. Each inductor includes multiple first segments in a first metal layer; multiple second segments in a second metal layer; first and second inputs, and multiple through vias coupling the first and second segments to form a continuous path between the first and second inputs. The first input of the first inductor is coupled to an amplifier input; the first input of the second inductor is coupled to the first transistor gate; the first input of the third inductor is coupled to the first transistor drain, the first input of the fourth inductor is coupled to an amplifier output. The second inductor inputs and the first transistor source are coupled to ground.

Three dimensional inductor, transformer and radio frequency amplifier

A first semiconductor tier has a first tier-to-tier connector for detecting a tier-to-tier coupling in a stacked integrated circuit (IC) device. A second semiconductor tier has a second tier-to-tier connector configured to electrically couple to the first tier-to-tier connector. A tier-to-tier detection circuit electrically couples to the second tier-to-tier connector. The tier-to-tier detection circuit generates an output signal indicative of an electrical coupling between the first semiconductor tier and the second semiconductor tier.

Circuit for detecting tier-to-tier couplings in stacked integrated circuit devices

A semiconductor die includes a semiconductive substrate layer with first and second sides, a metal layer adjacent the second side of the semiconductive substrate layer, one or more active devices in an active layer on the first side of the semiconductive substrate layer; and a passive device in the metal layer in electrical communication with the active layer. The passive device can electrically couple to the active layer with through silicon vias (TSVs).

Techniques for placement of active and passive devices within a chip

A method for manufacturing a semiconductor device includes fabricating an active layer on a first side of a semiconductor substrate. The method also includes fabricating a metal layer on a second side of the semiconductor substrate. The metal layer includes a passive device embedded within the metal layer. The passive device can electrically couple to the active layer with through vias.

In one particular embodiment, an integrated circuit includes a package and a substrate electrically and physically coupled to the package. The package includes a first package-substrate connection, a second package-substrate connection, and metallization coupling the first package-substrate connection to the second package-substrate connection. The substrate is coupled to the package via the first package-substrate connection and the second package-substrate connection. The substrate includes a plurality of power domains and a power control unit. The second package-substrate connection of the package is coupled to a particular power domain of the plurality of power domains. The power control unit includes logic and a switch, where the switch includes a first terminal coupled to a voltage supply terminal, a control terminal coupled to the logic, and a second terminal coupled to the first package-substrate connection of the package. The logic selectively activates the switch to distribute power to the particular power domain via the metallization of the package.

System and method of silicon switched power delivery using a package

A first I/O pad has a first type transistor disposed at a first end of the first I/O pad. A second I/O pad has another first type transistor disposed at a first end of the second I/O pad. The first end of the first I/O pad abuts the first end of the second I/O pad, so the first type transistor is adjacent to the other first type transistor.

Method and apparatus for forming I/O clusters in integrated circuits

A three dimensional on-chip inductor, transformer and radio frequency amplifier are disclosed. The radio frequency amplifier includes a pair of transformers and a transistor. The transformers include at least two inductively coupled inductors. The inductors include a plurality of segments of a first metal layer, a plurality of segments of a second metal layer, a first inductor input, a second inductor input, and a plurality of through silicon vias coupling the plurality of segments of the first metal layer and the plurality of segments of the second metal layer to form a continuous, non-intersecting path between the first inductor input and the second inductor input. The inductors can have a symmetric or asymmetric geometry. The first metal layer can be a metal layer in the back-end-of-line section of the chip. The second metal layer can be located in the redistributed design layer of the chip.

Three dimensional inductor and transformer

In one particular embodiment, an integrated circuit includes a package and a substrate electrically and physically coupled to the package. The package includes a first pin, a second pin, and metallization coupling the first pin to the second pin. The substrate is coupled to the package via the first pin and the second pin. The substrate includes a plurality of power domains and a power control unit. The second pin of the package is coupled to a particular power domain of the plurality of power domains. The power control unit includes logic and a switch, where the switch includes a first terminal coupled to a voltage supply terminal, a control terminal coupled to the logic, and a second terminal coupled to the first pin of the package. The logic selectively activates the switch to distribute power to the particular power domain via the metallization of the package.

A method of testing a die having a non-testable circuit, where the non-testable circuit is logically incomplete and forms part of a logically complete multiple tier circuit. The method includes reconfiguring a tier-to-tier input point or tier-to-tier output point associated with a primary path of the non-testable circuit to create a logically complete secondary path for the tier-to-tier point such that the non-testable circuit can be tested. Testable dies and methods of preparing such dies are also provided.

Testing circuit split between tiers of through silicon stacking chips

A device is disclosed that includes a first pin to supply power to a first power domain of an integrated circuit, a second pin to supply power to a second power domain of the integrated circuit, a switching regulator and a controller. The switching regulator is coupled to the first pin to provide a first regulated power supply to the first power domain and is coupled to the second pin to provide a second regulated power supply to the second power domain. The controller is coupled to the first pin and to the second pin to selectively reduce current flow to at least the second pin during a low power event.

System and method of power distribution control of an integrated circuit

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Dripping Springs, TX, United States of America

Thomas R Toms