Agilent Technologies, Inc.

Hewlett-Packard Company

Keysight Technologies, Inc.

Thomas R Fay

Jonathan Helfman

Stanley Ted Jefferson

Carl E Benvenga

William A Groves

William Hobson Wubbena

Darvin Dale Raph

Vance R Harwood

Michael A Teska

Elton C Bingham

A method of operating a data processing system to operate a first instrument and a second instrument connected to the data processing system is disclosed. The method includes displaying a measurement table. The data processing system receives user input defining a first parameter that is to be varied during a testing procedure by the first instrument and a first measurement to be made by the second instrument during the test procedure, a plurality of first parameter values to be used in the testing procedure. The data processing system causes the first instrument to provide each of the first parameter values and the second instrument to make the measurement and enter the measurement in a corresponding cell of a second row in the measurement table when the first instrument provides each of the first parameter values.

Method for automating instrument tests

A test sequencer software application and method for management and execution of sequence items. The test sequencer software application includes a management module and an execution module. The management module has capabilities of obtaining multiple sequence items definitions, of obtaining configuration information, of creating multiple lists of ordered sequence items from the sequence items definitions, and of separately linking each list of sequence items to one of multiple sequence engines from the configuration information. The execution module includes a sequencer controller module and the multiple sequence engines. The sequence controller module activates each of the multiple sequence engines in a preselected order and each sequence engine executes the ordered sequence items in each list linked to that sequence engine.

Test sequencer and method for management and execution of sequence items

In one embodiment, test execution times are determined for a plurality of tests that are to be executed for a single unit under test (UUT). Test dependencies are also determined for the tests, as are the instruments needed to execute the tests. Then, in response to the test execution times, the test dependencies, and the instruments needed to execute the plurality of tests, a plurality of different and synchronized test execution orders for the plurality of tests are developed. Each of the test execution orders specifies a sequence of tests that is to be executed for one of a plurality of UUTs that are to be tested in parallel; and, typically, the plurality of different test execution orders will be constrained to develop different test execution orders that optimize a total time to test the plurality of UUTs, a usage cost of instruments used to test the plurality of UUTs, or both. Other embodiments are also disclosed.

Methods and apparatus for eliminating lower value tests for a unit under test, and for developing a plurality of different and synchronized test execution orders for testing a plurality of units under test

The present invention provides an active data type for use in a computer program. The active data type has an identifier and at least one algorithm associated therewith. The identifier is utilized by the computer program to identify the instance of the active data type. The algorithm is configured to be automatically executed when an attempt to access a value associated with the active data type instance is made by a routine or otherwise. When a particular routine that uses an instance of the active data type attempts to access the value associated with the active data type, the algorithm determines the value associated with the active data type before the routine obtains access to the value. The active data type may be a real, an integer, or a string, for example. The algorithm automatically determines the current value associated with the active data type instance. Preferably, the active data type has an identifier, a first algorithm and a second algorithm associated therewith. The first algorithm preferably automatically determines the current value of the instance of the active data type when a routine that utilizes the value of the active data type instance attempts to access the value. When the value of the instance of the active data type is set, the second algorithm preferably automatically post-processes the value to which the active data type instance has been set. A locking/unlocking mechanism sets the value of the active data type instance prior to the first algorithm invoking the particular routine, suspends active data type algorithm processing while the routine executes, and processes the value of the active data type instance using the second algorithm once the routine has returned in order to post-process any changes to the value of the active data type instance.

Active data type variable for use in software routines that facilitates customization of software routines and efficient triggering of variable processing

The present invention is a method and instrument for testing a device. The device under test (DUT) may be an electronic device, circuit, PCB, or product. The present invention compares events measured on a known good DUT with events measured on a potentially faulty DUT. Events on the DUT may be stimulated by injecting one or more input signals into the DUT. Events are observed and measured at signal nodes termed &ldquo;observation nodes.&rdquo; Events at the observation nodes are recorded and compiled into event lists. Event lists for a potentially faulty DUT are time aligned and compared with event lists for a known good DUT to determine whether the potentially faulty DUT is or is not actually faulty. The present invention can intelligently adapt the selection of observation nodes, on the basis of information about a DUT, to produce the most useful event lists for comparison. The present invention can backtrace through the event lists to determine the earliest or most upstream observation nodes at which the events of the potentially faulty DUT substantially differ from the events of the known good DUT. In this way, the cause of a fault can be isolated and repaired quickly. The present invention also can learn the fault cause and repair information in order to suggest the cause and needed repair when a similar event is observed on another DUT of the same type.

Event based fault diagnosis

A method and apparatus are disclosed for reducing the likelihood of damage to digital logic devices under test or located in close electrical proximity to the device under test while attempting to locate faults in circuit assemblies using digital incircuit test techniques.

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Fort Collins, CO, United States of America

Thomas R Fay