International Business Machines Corporation

Other

Thomas P Moyer

David Clifford Long

Mario John Interrante

Glenn A Pomerantz

Thomas Weiss

Mark J LaPlante

Charles Hampton Perry

Lewis Sigmund Goldmann

Keith Howard Tabakman

Luc Gilbert Guerin

Harvey Charles Hamel

Keith C O'Neil

Karl J Puttlitz, Sr

Michael Berger

James Ralph Case

Gregory Blair Martin

Brian M Trapp

John E Kozol

Laszlo Kando

Marlene W Moyer

Absolute, non-juxtaposed position encoders (i.e., position-determining systems) for up to six degrees-of-freedom are described. Each of these apparatus includes a display, an observation device, display circuitry, and logic circuitry. The display includes a plurality of pixels. In addition, the observation device is capable of observing light emitted from a region of the display. The display circuitry is able to cause one or more emissive patterns to be displayed on the display. The logic circuitry is able to determine a position of the observation device relative to the display at least in part from the light observed by the observation device. The observation device is capable of being moved in relation to the display, or vice versa. Aspects of the invention are suitable for use in a diverse set of applications such as: autonomously-piloted vehicles, multi-axis robotic arms, three-dimensional (3D) printers, computer-numerical-control (CNC) machine tools, and cranes.

Apparatus and methods utilizing emissive patterns to determine positional information

A computing system, method, and computer program product facilitates data mining of information, for example image data, relating to a surface of a manufactured product when the manufactured product is processed using a tool relative to which the manufactured product may be randomly oriented. For each manufactured object, data pertaining to the surface is converted into a weight distribution. A rotational axis along which each surface would tend to rotate under the action of gravity with the surface supported at its geometric centroid is determined. The sets of data can then be properly oriented relative to one another for data mining by aligning the rotational axis of each set of data.

Method and system of data weighted object orientation for data mining

A method, system, program product and database for electronic circuit design configured to reduce data storage and computer resource requirements. The invention is binary based and leverages the redundancy of features in most electronic circuit designs by using templates of unique design features. Each template includes offset instructions for positioning the unique design feature relative to a control point rather than a previous feature. The control point is positioned within a design grid according to data in a template recall that replaces the unique design feature's instruction set in an instruction list of a design instruction file. Because each template is stored once, and only once, considerable reduction in design data size is achieved. In addition, each template recall has a fixed width data format that restrains data size and allows more efficient processing.

Electronic circuit design

A method of forming an electrical connector including providing a metallic sheet having a multitude of connector blanks formed therein, each of the connector blanks having a base portion, a contact portion and a singulation arm; forming each of the connector blanks into a connector having a predetermined shape wherein each of the connectors remain connected to the metallic sheet by their respective singulation arms and wherein the singulation arms are nonplanar with respect to the metallic sheet; joining the base of each of the connectors to a first substrate; and severing the singulation arms to separate each of the connectors from the metallic sheet wherein the base of each of the connectors is joined to the first substrate. In a preferred embodiment, the contact portion contacts a second substrate.

Method of forming an electrical connector

An apparatus for abrading a substrate including a moveable abrading tool having a bur for abrading the substrate, a stage for supporting the substrate, and a height sensing device in communication with the abrading tool to determine a vertical position of the bur with respect to the substrate. Further disclosed is a method for abrading a substrate using the foregoing apparatus including moving the abrading tool across the substrate so as to abrade the substrate, determining the vertical position of the bur with the height sensing device, and communicating the vertical position of the bur to the abrading tool.

Method and apparatus for abrading a substrate

An electrical connector arrangement for connecting electronic devices to one another. The connector arrangement uses tensile members and compression members, at least the tensile members of which act to provide both an electrical connection between electronic devices and force over a range of distances to hold the devices together. The tensile members provides tensile force acting to hold the electronic devices together while the compression members provide an opposing compressive force over a range of distances which balances the tensile force to thereby form a cellforce connector used to connect an array of electrical contact points on one electronic device to a corresponding array of electrical contact points on another electronic device.

Mechanical attachment means used as electrical connection

A method for testing the integrity at least two test objects, each object is made of a plastically deformable material, by a. contacting a moving means with the objects at a first point in time, the moving means at a first position and the objects at a first position, the moving means having a shaped portion; b. shifting at least a portion of the objects to a second position at a second time, subsequent to the first time, wherein at least a portion of the objects were displaced during the interval between the first time and the second time; c. evaluating the objects after the shifting in step b. 22.

Method and apparatus for the testing of plastically deformable objects

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Lagrangeville, NY, United States of America

Thomas P Moyer