Carl Zeiss Microscopy Gmbh

Carl Zeiss Industrielle Messtechnik Gmbh

Thomas Milde

Lars Stoppe

Johannes Winterot

Max Funck

Johannes Knoblich

Peter Schacht

Toufic Jabbour

Daniel Stegmann

Daniel Harangozo

Michael Totzeck

Marco Hanft

Christoph Husemann

Frank Widulle

Andrea Berner

Dominik Stehr

Christian Platt

Bernhard Wiedemann

In a method for additive manufacturing of a workpiece, a data set defines the workpiece in multiple layers. A first energy beam is moved relative to a manufacturing platform along first trajectories to produce, in temporally successive steps, a stack of workpiece layers. Individual properties of the stack are determined using a measurement arrangement having an exciter that excites the stack with a second energy beam, and having a detector that detects properties of the stack resulting from an excitation along a defined detection path in a spatially resolved manner. At least one of the second energy beam and the detection path is moved relative to the manufacturing platform along further trajectories using a further scanning unit. The first scanning unit and the further scanning unit establish completely separate beam paths for the first energy beam and the at least one of the second energy beam and the detection path.

Method and apparatus for additive manufacturing of a workpiece

The invention relates firstly to a method for determining a mechanical deviation on a displacement path of an optical zoom lens, in particular on a displacement path of an optical zoom lens of a microscope. The optical zoom lens is arranged in a beam path between an object to be recorded and an electronic image sensor. In a first method step, an optical marker is introduced into the beam path at a position of the beam path located between the object to be recorded and the optical zoom lens, such that the optical marker passes the optical zoom lens and then is depicted on an image in which a position of the optical marker is detected and determined. This is compared with a reference position of the optical marker in order to determine the mechanical deviation on the displacement path of the optical zoom lens. The invention further relates to a method for correction of a displacement error of an image recorded by an electronic image sensor and to an electronic image recording device.

Method for determining a deviation on a displacement path of an optical zoom lens and method for correction and image recording device

An optical system includes an illumination module configured to illuminate a sample object with at least one angle-variable illumination geometry. The optical system includes an imaging optical unit configured to produce an imaged representation of the sample object that is illuminated with the at least one angle-variable illumination geometry on a detector. The optical system includes the detector, which is configured to capture at least one image of the sample object based on the imaged representation. The optical system includes a controller configured to determine a result image based on a transfer function and the at least one image. A method includes illuminating a sample object with at least one angle-variable illumination geometry, imaging the sample object on a detector, based on the imaged representation, capturing at least one image of the sample object, and, based on a transfer function and the at least one image, determining a result image.

Material testing by angle-variable illumination

A detection optical unit () of an optical apparatus is configured to produce an imaged representation () of a sample object () on a detector (). An adjustable filter element () is arranged in a beam path of the detection optical unit () that defines the imaged representation (). A controller is configured to drive the adjustable filter element () to filter the spectrum of the beam path with a first filter pattern (-) and with a second filter pattern (-) and to drive the detector () to capture a first image, associated with the first filter pattern (-), and to capture a second image, which is associated with the second filter pattern (-). The controller is furthermore configured to determine a focus position () of the sample object () based on the first image and the second image. The first filter element (-) here defines a first line and the second filter element (-) defines a second line.

Digital determination of focus position

The invention relates firstly to a method for determining a mechanical deviation on a displacement path of an optical zoom lens (), in particular on a displacement path of an optical zoom lens () of a microscope. The optical zoom lens () is arranged in a beam path () between an object () to be recorded and an electronic image sensor (). In a first method step, an optical marker is introduced into the beam path () at a position of the beam path () located between the object () to be recorded and the optical zoom lens (), such that the optical marker passes the optical zoom lens () and then is depicted on an image in which a position of the optical marker is detected and determined. This is compared with a reference position of the optical marker in order to determine the mechanical deviation on the displacement path of the optical zoom lens (). The invention further relates to a method for correction of a displacement error of an image recorded by an electronic image sensor () and to an electronic image recording device.

An adapter is suitable for adapting a microscope objective to an electronic interface of a digital microscope. A method includes measuring and storing optical properties of the microscope objective; measuring a storing mechanical properties of the microscope objective; and providing the stored optical and mechanical properties to the electronic interface as optical and mechanical data. The adapter includes a mechanical interface having an adjuster for adjusting the optical components of the standard objective, a digital memory, an electronic interface and at least one electronic component for providing the data of the digital memory to the electronic interface.

Method and adapter for adapting a microscope objective to a digital microscope

The invention relates to a reflection correction method for correcting digital microscopic images. Here, the reflection correction method comprises: illuminating an object, the illuminating of the object having at least two illumination patterns. Creating an illumination pattern image of the object for each illumination pattern. Calculating at least one partial reflection image, in each case by means of a combination of corresponding two illumination pattern images. Calculating a reflection-corrected image of the object by means of a suitable combination of at least one illumination pattern image and at least one partial reflection image. And, in this case, each illumination pattern as at least one active illumination source, and each illumination pattern is different from all others. Furthermore, the invention relates to an associated reflection-correcting device.

Method for reflection correction of images and devices in this regard

The invention relates to a reflection-reduced contrast imaging method and to a device for generating a reflection-reduced contrast image, preferably from microscopic images, in particular in order to read height progression information of a condition of an object. The reflection-reduced contrast imaging method comprises: illuminating an object by means of an illumination sequence, creating an illumination image of the object for each illumination of the object of the illumination sequence, determining a reflection-corrected illumination image for each illumination image, superposing each pair of reflection-corrected illumination images that are adjacent with respect to the first axis in order to form a first whole axis image of the first axis, superposing each pair of reflection-corrected illumination images that are adjacent with respect to the second axis in order to form a second whole axis image of the second axis, creating a first color progression image on the basis of the first whole axis image, creating a second color progression image on the basis of the second whole axis image, transforming the first color progression image and the second color progression image into a color space, generating a contrast image on the basis of the first color progression image and the second color progression image transformed in the color space.

Method for generating a reflection-reduced contrast image and corresponding device

The invention relates to a method of correcting illumination-dependent aberrations in a modular digital microscope comprising a coaxial bright field illumination apparatus, a motor-driven zoom apparatus, an objective, a digital image acquisition unit and an image processing unit. The method according to the invention is based on the use of calibration data, which are preferably stored in the image processing unit as a calibration data record. The calibration data record is established for each combination of objective and zoom and stored in a data memory. The method is integrated into the image processing unit for live-correction or available as software for image post-processing of microscope images. The invention further relates to a digital microscope.

Method for correcting illumination-dependent aberrations in a modular digital microscope, digital microscope and data-processing program

For image recording purposes, an object is illuminated at a plurality of illumination angles. A detector captures a plurality of images (-) of the object for the plurality of illumination angles. An electronic evaluating device applies an image correction to the plurality of images (-), said image correction comprising a rectification (T, T, T), wherein the rectification (T, T, T) depends on the illumination angle used when recording the respective image (-). The corrected images (-) may be combined.

Image capturing device and method for image capturing

The invention relates to a method for calibrating a digital optical imaging system, comprising at least one motorized or coded zoom system and an image sensor, to a method for correcting aberrations in such an imaging system, and to an optical imaging system which is configured to carry out the methods according to the invention. During the calibration method, a reference object is recorded in various zoom settings and the image is corrected pixel-wise with digital-optical means using a previously determined model. To this end, distortion correction coefficients and image stability correction coefficients are ascertained. The real total magnification of the system is ascertained from the corrected image. The model ascertained in the calibration process also serves for correcting aberrations during operation of the imaging system.

Method for calibrating a digital optical imaging system having a zoom system, method for correcting aberrations in a digital optical imaging system having a zoom system, and digital optical imaging system

The invention relates to a method for calibrating an optical instrument which comprises at least a motorized zoom system, an objective, an image sensor and an image processing unit. The method comprises the following steps: establishing calibration data Dof the zoom system with a reference objective and storing these in an internal memory of the zoom system; establishing calibration data Dof the objective with a reference zoom system and storing these in an internal memory of the objective; reading the internal memories of the zoom system and of the objective and applying a digital-optical correction of an image acquired by an image sensor with the calibration data Dand D. The invention moreover relates to an optical instrument, in particular a digital microscope, to which the calibration method according to the invention can be applied.

Growing community of inventors

Nausnitz, Germany

Thomas Milde