Lsi Logic Corporation

Palo Alto Research Center Inc.

Thomas Long

Peter Johan Nystrom

Karl Anthony Littau

Steven A Buhler

Cathie J Burke

Scott Eugene Solberg

Michael C Weisberg

Richard Schmachtenberg, Iii

Scott Jong Ho Limb

Sharon S Berger

Michael Yu Tak Young

Beverly Russo

Timothy Trang

A liquid drop ejector comprising a jet stack, thin film or thick film heaters formed on the surface of the jet stack, and at least one thin film or thick film temperature sensor operative to provide feedback temperature control for the thin film or thick film heater elements is provided. In one form, the liquid drop ejector also has the thin film or thick film heater elements grouped in segments that are operative to be individually controlled. In addition, in another form, the signal lines provided to the liquid drop ejector are patterned to allow for more uniform resistance over the span of the liquid drop ejector.

Thin film and thick film heater and control architecture for a liquid drop ejector

A system for identifying a substrate based on indicia formed in a surface of the substrate. The method includes forming the indicia having edge features and substantially flat features. The indicia is illuminated with incident illumination from an illumination source while moving the illumination source relative to the substrate, thereby scanning the incident illumination over the indicia. Reflected illumination having a first intensity level is received from the edge features of the indicia, and reflected illumination having a second intensity level is received from the substantially flat features of the indicia. The reflected illumination is detected to produce at least one output signal having a first amplitude level corresponding to the first intensity level and a second amplitude level corresponding to the second intensity level. The output signal is processed based at least in part upon the first and second intensity levels to form at least one image portion of the indicia. The indicia is recognized based at least in part upon the at least one image portion. The substrate is then identified based on the indicia.

Substrate surface scanning

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Corbett, OR, United States of America

Thomas Long