Carl Zeiss Microscopy Gmbh

Carl Zeiss Ag

Thomas Kalkbrenner

Ralf Wolleschensky

Helmut Lippert

Jörg Siebenmorgen

Ingo Kleppe

Ralf Netz

Yauheni Novikau

Tiemo Anhut

Joerg Siebenmorgen

Daniel Schwedt

Saskia Pergande

Matthias Wald

Thomas Ohrt

Michael Goelles

Wolfgang Singer

Tobias Kaufhold

Artur Degen

Lars-Christian Wittig

Michael Gölles

Andreas Möbius

Michael Totzeck

Daniel Haase

Manuel Amthor

Gerhard Krampert

Wolfgang Bathe

Nils Langholz

Peter Schacht

Jakob Haarstrich

Martin Beck

Franz Reischer

Jörg Ritter

Sebastian Borck

Jorg Engel

Stephan Kuppig

Jörg Engel

Techniques an apparatuses for localizing objects of a sample that emit detection radiation are disclosed. At least one light sheet is produced in a light sheet plane and a region of the sample to be imaged is illuminated with the light sheet and detection radiation from the sample is spatially resolved in a detection plane. A light sheet is produced that has, in the light sheet plane, a non-illuminated light sheet section delimited by an illuminated light sheet section or is produced sequentially in the light sheet plane, where a non-illuminated light sheet section remains between the sequentially produced light sheets. An object to be localized is present in the non-illuminated region, and a position of the object is captured if it leaves the non-illuminated region and is excited to emit the detection radiation by one of the light sheets delimiting the non-illuminated region.

Method and apparatus for localizing objects by means of a light sheet

A method for light sheet microscope examination of a specimen, the specimen being illuminated with a light sheet by an illumination objective, and a light sheet microscope for performing the method. Light emitted by the specimen is imaged onto an area-type detector by a detection objective. An optical axis of the detection objective encloses with an optical axis of the illumination objective an angle that differs from 0° and from 180° and intersects the light sheet in a light sheet plane. The area-type detector records an image. A neural network analyzes the image to determine whether the light sheet plane is located in a focal plane of the detection objective, and/or in which direction along the optical axis the light sheet plane is located from the focal plane, and/or at what distance, measured along the optical axis of the detection objective, the light sheet plane is from the focal plane.

Method and apparatus for analysis of a sample by light sheet microscopy

A sample chamber encloses a sample space for positioning a sample and includes a wall that delimits the sample space and has an outer side facing away from the sample space. An illumination beam path is directed through the outer side into the sample space. Detection radiation is detected along a detection axis extending from the sample chamber through the wall of the sample chamber. The sample chamber has an outer surface with a shape of a spherical section with a circular disc as the base surface. The sample chamber and the detection axis are rotated and/or pivoted relative to one another about the center point of the circular disc so that different angular positions of the sample chamber relative to the detection axis are adjusted and image data is recorded at different angular positions of the sample chamber relative to the detection axis.

Method for operating a sample chamber for microscopic imaging, apparatus, and sample chamber

A single plane illumination microscope having an illumination optical system for illuminating a sample located on a sample carrier in a medium, and which is parallel to a planar reference surface. The sample is illuminated by a light sheet via an illumination light path. A detection optical system has a detection beam path. The optical axes of the illumination and detection optical systems each define an angle that is not equal to zero degrees along with the normal to the reference surface. A barrier layer system includes at least one layer of a given material having a given thickness and separates the medium from the illumination and detection optical systems. A base area of the barrier layer system is in contact with the region that is accessible for illumination and detection activities, said base area running parallel to the reference surface. At least one corrective element in the illumination beam path and/or the detection beam path allows those aberrations to be reduced which are created when light to be detected or light for illuminating the sample penetrates interfaces of the barrier layer system at an angle. The microscope has means, which are independent of the generation of the light sheet, for applying, via at least one manipulation beam path, light intensity to the sample in substantially point-shaped regions of the light sheet plane or in a given volume that at least temporarily encompasses the light sheet plane.

Single plane illumination microscope

An optical lens for use in a media feed device, having a first lens surface and a second lens surface, wherein the first lens is provided to be facing an object to be observed and the second lens surface is provided to be facing away from the object to be observed. At least one channel opening onto the first lens surface is present, wherein the at least one channel runs through the optical lens and at least one section of a media line is formed in the at least one, channel or, if a plurality of channels are formed, at least one of the plurality of channels opens up outside a highest point in alignment with a line that is vertical with respect to the first lens surface and to the surface of the earth.

Optical lens for use in a media supply device and lens, media supply device and microscope

The invention relates to a localization microscopy method for localizing signal sources. Here, at least once for each pixel of a detector, values of an error parameter are ascertained and stored in a calibration data record in a manner assigned to the relevant pixel. Captured image data are used to identify regions of origin of signal sources and fit a point spread function to the pixel values of the respective regions of origin. The respective signal source is localized on the basis of the point spread function. The pixel-specific error parameter of each pixel can be compared to a threshold. If the threshold is exceeded, these pixels are either ignored or replaced by means of interpolation when fitting the point spread function. In addition or as an alternative thereto, the real noise performance of the pixels is ascertained and corrected on the basis of derived pixel-specific error parameters.

Method for localizing signal sources in localization microscopy

A method for optically examining a plurality of microscopic samples. The samples are channeled one after the other by means of a flow into at least one flow channel in which the samples advance along a flow direction. The samples are illuminated, and light emitted from the samples is detected and analyzed. A device for carrying out the method in which samples are illuminated in that at least one light sheet with a light sheet plane is directed onto the at least one flow channel, wherein the light sheet is oriented so as to intersect the at least one flow channel in an intersection region, and the normal of the light sheet plane forms an angle differing from null together with the flow direction in the intersection region. The light emitted from the sample is registered by an imaging optical detection unit, and the focal plane of said optical detection unit lies in the intersection region.

Method and device for optically examining a plurality of microscopic samples

The invention relates to an illumination apparatus for a microscope, a microscope and a method for operating the illumination apparatus. The illumination apparatus has a sample space for holding a sample that is to be illuminated, and at least one laser light source. An objective for the directional emission of laser radiation of a first wavelength along a first optical axis that is directed into the sample space, and with a cover of the sample space by which the sample space is delimited at least on one of its sides. The cover further has a layer that is either impenetrable for the laser radiation over a blocking angle range of the illumination angle and is transmissive for radiation of a second wavelength over a transmitted light angle range, or has a controllable layer that, in a first control state, is transparent for radiation of the second wavelength and, in a second control state, is impenetrable for the laser radiation of the first wavelength.

Illumination apparatus for a microscope, method for operating it, and microscope having an illumination apparatus

A localization microscope including an imaging device emitting sample light from a focal plane into an image plane, including an optical-manipulation device for depth-dependent influencing of a point-spread function of the imaging and influencing the point-spread function of the imaging such that a point emitter is imaged in the image plane into an image that is rotationally asymmetrically distorted. A form of the distortion depends on the location of the point emitter with respect to the focal plane and a wavelength of the sample light. The optical manipulation device includes first and second anisotropy elements that anisotropically influence the point spread function to produce rotational asymmetry of the point emitter image. The elements are arranged one behind the other in the imaging direction, with anisotropy axes at an angle to one another. Both elements have differing neutral wavelength at which they do not anisotropically influence the point spread.

Spectrally-resolving high-resolution 3D localization microscopy

A method for adjusting a specimen holder in the beam path of a microscope, in which at least one beam of an illumination radiation is directed onto the specimen holder; a component of the illumination radiation reflected by the specimen holder is captured by means of a detector and measurement values of the captured illumination radiation are ascertained. A current actual manner of positioning of the specimen holder in relation to the beam path is established depending on the measurement values; the established actual manner of positioning is compared to an intended manner of positioning, and control commands for modifying the actual manner of positioning are produced, the execution of which causes the specimen holder to be moved into the intended manner of positioning.

Inclination measurement and correction of the cover glass in the optical path of a microscope

A method for operating a microscopy arrangement, and a microscopy arrangement, having a first microscope and at least one further microscope, wherein each of the microscopes have a respective optical axis. The respective optical axes do not coincide. The method provides a three-dimensional reference coordinate system being set; a carrier apparatus, that is embodied in the arrangement to receive and hold a specimen carrier is introduced into a specimen plane of the first microscope that is intersected by the optical axis and onto the optical axis of the first microscope; a reference point is set on the optical axis of the first microscope; the carrier apparatus is delivered to the further microscope, wherein the current coordinates of the reference point are continuously captured and compared to the coordinates of the optical axis of the at least one further microscope; and the reference point is brought onto the optical axis of the at least one further microscope.

Method for operating a microscopy arrangement and microscopy arrangement having a first microscope and at least one further microscope

Specimen delimiting element which, at least in one region, has a nano-porous material which is transparent to at least one observation radiation which is capturable by means of a microscope. The nano-porous material has pores, the mean pore diameter of which is smaller than the wavelength of the observation radiation, and a proportion of at least 5% of the volume of the nano-porous material is taken up by the pores at least in portions of said nano-porous material. The material has an open porosity, the mean pore diameter is at most 1000 nm, and the number of pores per unit volume of the nano-porous material and/or the mean pore diameter changes/change along at least one extent of the specimen delimiting element, such that a pore gradient is formed in the specimen delimiting element, and has at least one gradient portion in which no porosity is present, such that a separation of a specimen medium on one side surface of the specimen delimiting element and an immersion medium on an opposite side surface of the specimen delimiting element is effected by means of the specimen delimiting element. The invention furthermore relates to a microscopy method and to a microscope using the specimen delimiting element.

Specimen delimiting element, microscopy method and microscope

A microscopy method, and related microscope, including producing illumination radiation and directing it at a focus. The illumination radiation is switched temporally between at least two modes, such that focus modulation is effected at which temporally varying and mutually different mode fields of the illumination radiation are produced in the focus. The focus is guided at least over regions of a sample to be examined, wherein detection radiation in the sample is or may be brought about by the illumination radiation in the focus at least at a point of origin. The detection radiation is captured in a manner assigned to the at least one point of origin. In addition to the illumination radiation, at least one disexcitation beam of rays of disexcitation radiation is directed at the focus. The disexcitation radiation prevents the detection radiation from being brought about in the region that is illuminated by the disexcitation radiation.

Microscopy method using temporal focus modulation, and microscope

An arrangement for microscopy, having an illumination optical unit with an illumination objective for illuminating a specimen on a specimen carrier. An optical axis of the illumination objective lies in a plane which includes an illumination angle that differs from zero with the normal of a specimen plane and the illumination is implemented in the plane. A detection optical unit with a detection objective is located in a detection beam path. The optical axis of the detection objective includes a detection angle that differs from zero with the normal of the specimen plane. The illumination objective and/or the detection objective has an illumination correction element. A meniscus lens is located between the specimen carrier and the illumination and detection objectives being arranged both in the illumination beam path and in the detection beam path.

Arrangement for microscopy and for correction of aberrations

The invention relates to an immersion matrix (), designed for adjusting optical properties at interfaces of optical arrangements, having a porosity with pores of at least one pore size selected from a range from &#x3e;20 nm to 200 &#x3bc;m and/or nanopores in the material of the immersion matrix (), wherein the nanopores have at least one average pore size selected from a range of 0.5 nm to 20 nm, and an elasticity modulus E selected from a range of 0.1-100 MPa. The invention furthermore relates to the use of the immersion matrix (), an arrangement with the immersion matrix and an immersion device.

Growing community of inventors

Jena, Germany

Thomas Kalkbrenner