Growing community of inventors

Stanford, CA, United States of America

Thomas Kailath

Average Co-Inventor Count = 2.42

ph-index = 12

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 949

Thomas KailathHamid K Aghajan (4 patents)Thomas KailathArogyaswami J Paulraj (3 patents)Thomas KailathCharles Daniel Schaper (2 patents)Thomas KailathRichard H Roy, Iii (2 patents)Thomas KailathYagyensh C Pati (1 patent)Thomas KailathR Fabian Pease (1 patent)Thomas KailathMark A McCord (1 patent)Thomas KailathXun Chen (1 patent)Thomas KailathBabak H Khalaj (1 patent)Thomas KailathKhalid A El-Awady (1 patent)Thomas KailathTodd K Citron (1 patent)Thomas KailathKhalid El-Awady (1 patent)Thomas KailathAmir A Ghazanfarian (1 patent)Thomas KailathTiejun J Shan (1 patent)Thomas KailathThomas Kailath (13 patents)Hamid K AghajanHamid K Aghajan (4 patents)Arogyaswami J PaulrajArogyaswami J Paulraj (84 patents)Charles Daniel SchaperCharles Daniel Schaper (12 patents)Richard H Roy, IiiRichard H Roy, Iii (8 patents)Yagyensh C PatiYagyensh C Pati (18 patents)R Fabian PeaseR Fabian Pease (11 patents)Mark A McCordMark A McCord (2 patents)Xun ChenXun Chen (1 patent)Babak H KhalajBabak H Khalaj (1 patent)Khalid A El-AwadyKhalid A El-Awady (1 patent)Todd K CitronTodd K Citron (1 patent)Khalid El-AwadyKhalid El-Awady (1 patent)Amir A GhazanfarianAmir A Ghazanfarian (1 patent)Tiejun J ShanTiejun J Shan (1 patent)
..
Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Leland Stanford Junior University (12 from 5,303 patents)

2. Other (1 from 832,680 patents)


13 patents:

1. 6353209 - Temperature processing module

2. 6064486 - Systems, methods and computer program products for detecting the

3. 5802856 - Multizone bake/chill thermal cycling module

4. 5583956 - Estimation of skew angle in text image

5. 5527645 - Systematic method for production of phase-shifting photolithographic

6. 5513275 - Automated direct patterned wafer inspection

7. 5418892 - Subspace-based line detection

8. 5345599 - Increasing capacity in wireless broadcast systems using distributed

9. 5311600 - Method of edge detection in optical images using neural network

10. 4965732 - Methods and arrangements for signal reception and parameter estimation

11. 4750147 - Method for estimating signal source locations and signal parameters

12. 4665523 - Method and means for error detection and correction in high speed data

13. 4641259 - Adaptive signal processing array with suppession of coherent and

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as of
12/7/2025
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