Leland Stanford Junior University

Centre National De La Recherche Scientifique

Sorbonne Université

Ecole Normale Superieure De Paris

Thomas Juffmann

Marian Mankos

Mark A Kasevich

Sylvain Gigan

Brannon Klopfer

Stewart A Koppell

Andrés De Los Ríos Sommer

A device for phase microscopy is disclosed that comprises a spatial light modulator and a connecting means adapted to fix the spatial light modulator onto a phase microscope. The phase microscope comprises a light path comprising at least a sample area, a light device for lighting said sample area, and an imaging device for capturing a phase image of said sample area. The phase image is a 2D matrix of pixels. The spatial light modulator is positioned in the light path in a conjugated plane of the sample area. The device also comprises a command of the spatial light modulator connected to the imaging device and adapted to measure the phase shift of a plurality of pixels of the phase image and to command the spatial light modulator in order to subtract the measured phase shifts.

High sensitivity phase microscopy imaging

Improved aberration correction in multipass electron microscopy is provided by having Fourier images of the sample (instead of real images) at the reflection planes of the resonator. The resulting &#x2212;1 magnification of the sample reimaging can be compensated by appropriate sample placement or by adding compensating elements to the resonator. This enables simultaneous correction of lowest order chromatic and spherical aberration from the electron objective lenses. If real images of the sample are at the reflection planes of the resonator instead, only the lowest order chromatic aberration can be corrected.

Aberration reduction in multipass electron microscopy

Growing community of inventors

Vienna, Austria

Thomas Juffmann