Hexagon Technology Center Gmbh

Leica Geosystems Ag

Agilent Technologies, Inc.

Hexagon Metrology Gmbh

Tesa Sa

Thomas Jensen

Johan Stigwall

Knut Siercks

Zheng Yang

Andreas Schwendener

Marcel Rohner

Peter Kipfer

Danick Brühlmann

Frank Przygodda

Benjamin Vullioud

Frank Saupe

Jürg Hinderling

Peter Champ

Bernhard Metzler

Bernhard Braunecker

Jochen Scheja

Bernd Nebendahl

Klaus Schneider

Claudio Iseli

Beat Aebischer

Reto Stutz

Dietrich Meier

Josef Müller

Thomas Ammer

Stefan Martin Benjamin Gächter Toya

Tim Mayer

Ruediger Maestle

Roland Zumbrunn

Laurent Stauffer

Julien Chardonnens

Yves Salvade

Marco Schröder

Alessandro Nardulli

Jürgen Schneider

Markus Fäs

Sébastien Le Floch

Peter Münstermann

Patrick Ilg

Alexandre Paduch

Eckhart Witzel

Michael Hermstein

Robert Godding

Lorenz Leimgruber

Matthias Geil

Sebastien Le Floch

Stefan Martin Benjamin GÄCHTER Toya

Peter MÜNSTERMANN

Danick BRÜHLMANN

A spherically mounted retroreflector comprising an optic inlay, the optic inlay comprising a retroreflector having a vertex and an axis of symmetry, and a carrier having an at least partly spherical outer surface and a cavity, wherein the optic inlay is arranged in the cavity, and wherein the at least partly spherical outer surface has a sphere center, which sphere center coincides with the vertex, wherein the optic inlay is connected to the carrier. The optic inlay comprises a coupling portion, and the spherically mounted retroreflector comprises a coupling element arranged between the optic inlay and the carrier.

Spherically mounted retroreflector

A measuring system for acquiring three-dimensional measuring points, comprising a base unit, a support unit mounted on the base unit and rotatable relative to the base unit around an azimuth axis, an emitting unit, a receiving unit, a directing unit mounted in the support unit, and configured for directing a transmission beam from the emitting unit towards a scene, directing a reception beam from the scene to the receiving unit, a first actuator configured for rotating the support unit relative to the base unit around the azimuth axis, a second actuator configured for rotating the directing unit relative to the support unit around the elevation axis, a first angle encoder configured for measuring a rotatory position of the support unit, a second angle encoder configured for measuring a rotatory position of the directing unit, a camera comprising an image sensor.

Measuring system with panoramic image acquisition functionality

A metrology system comprising a target object, a metrology instrument and a control unit configured for controlling an alignment of the targeting unit and for deriving an orientation of the target object. The metrology instrument comprises a zoom objective, an illumination unit and a time-of-flight sensor comprising an array of pixels and capable of providing range data for each pixel of the array as point cloud data, the time-of-flight sensor provides the distance measuring device. The control unit comprises an object determination functionality which provides receiving the point cloud data provided by the time-of-flight sensor, deriving a digital representation of the target object by processing the point cloud data, comparing the digital representation of the target object with a reference pattern of the target object, and determining the orientation of the target object based on the comparison of the digital representation of the target object with the reference pattern.

Metrology system

A triangulation device for measuring a measurement object by a projection of a structured light pattern onto the measurement object. The triangulation device includes a projector projecting the structured light pattern decomposable into different spatial frequencies onto the measurement object. The projector comprises a matrix of pixel elements and a lens system which determines a wavefront with a wavefront aberration from a reference wavefront, and a camera including a lens system and an imaging sensor, the camera being configured to receive the structured light pattern projected by the projector onto the measurement object, and a processing unit configured to provide distance information by evaluating imaging information provided by the camera. The wavefront aberration comprises a primary spherical aberration coefficient Z, wherein the primary spherical aberration coefficient Zis larger than 0.5λ, wherein λ is a wavelength of the projected structured light pattern.

Structured light projection through the minimization of visual artifacts by way of deliberately introduced optical aberrations

A reflector arrangement having at least one retroreflector and at least one sensor arrangement arranged downstream of the retroreflector in relation to a beam incidence direction, having a sensor. The sensor arrangement comprises a code element&#x2014;having a code pattern, and the retroreflector, the code element&#x2014;and the sensor are arranged in such a way that the code element&#x2014;is arranged between the retroreflector and the sensor and an angle-dependent position with respect to the optical axis of a projection of the code pattern onto the detection surface can be determined by means of the sensor.

Retroreflector with sensor

A reflector arrangement for determining the position or marking of target points, having at least one retroreflector, and a beam detection unit, by means of which the orientation measurement radiation passing through the retroreflector is acquirable. The beam detection unit comprises a first sensor for generating a signal in dependence on an acquisition of orientation measurement radiation and a first beam guiding unit. The first sensor and the first beam guiding unit are arranged such that a detection field of view for acquiring the orientation measurement radiation is defined, an alignment of the detection field of view around the yaw axis is variable and orientation measurement radiation passing through the retroreflector is acquirable in dependence on the alignment of the detection field of view with the first sensor.

Retroreflectors

A system for monitored additive manufacturing of an object, comprising a manufacturing unit], designed for additive manufacturing of the object based on metal-containing manufacturing material in a manufacturing volume, wherein the object is built up by repeated layer-by-layer provision of the manufacturing material in defined quantity and accurately-positioned forming of the provided manufacturing material. The system moreover comprises an optical checking unit having at least one projector and two cameras and a control and processing unit. The manufacturing volume comprises an optical transmission region, the projector and cameras&#x2014;are arranged outside the manufacturing volume in a fixed position relationship and are aligned in such a way that respective optical axes extend through a respective transmission region, by means of the projector, a projection can be generated on a manufacturing area and at least a common part of the manufacturing area on which the projection can be overlaid can be captured.

Additive manufacturing having optical process monitoring

A reflector arrangement for position determination and/or marking of target points, comprising a retroreflector and a first sensor arrangement, by means of which the orientation measurement radiation passing through the retroreflector is acquirable. The first sensor arrangement comprises a first optical assembly providing a fisheye lens, and a first sensor, wherein the retroreflector and the first sensor arrangement are arranged in such a way that orientation measurement radiation passing through the retroreflector is projectable onto the detection surface of the first sensor by means of the first optical assembly.

Retroreflector comprising fisheye lens

A triangulation scanner having a projection unit, at least one first image acquisition unit and one second image acquisition unit and a control and processing unit for deriving distance measured values from image information. The scanner comprises a third image acquisition unit and a fourth image acquisition unit and an acquisition zoom functionality for activating or reading out the sensors such that a respective first acquisition state and a respective second acquisition state can be provided for each sensor. The acquisition of an image corresponding to a field of view defined by the respective acquisition zoom level is provided by each such acquisition zoom level thus definable, wherein the fields of view are each different.

Adaptive 3D-scanner with variable measuring range

Surveying device comprising a base defining a base axis (A), a support structure arranged to be rotatable around the base axis (A) and defining a rotation axis (B), a light emitting unit for emitting measuring signal and a light receiving unit comprising a detector for detecting reflected measuring signal. A rotation unit is mounted on the support structure for providing emission and reception of measuring light in defined directions, wherein the rotation unit comprises a rotation body which is mounted rotatable around the rotation axis (B) and the rotation body comprises a scanning mirror which is arranged tilted relative to the rotation axis (B). The device comprises at least one projector fixedly arranged with the support structure, defining a particular optical axis and configured to direct a light pattern at a scene, wherein position and shape of the pattern are controllable by the controlling and processing unit.

Surveying instrument for scanning an object and for projection of information

An optical system comprising an optical coherence tomography (OCT) measuring device and a beam deflection unit for laterally deflecting the position or angle of a beam path of the OCT measuring device. There is an optical component in the beam path, said optical component being embodied in such a way that a back-reflection of the optical component has a different configuration in terms of its longitudinal location along the beam path depending on the lateral position of the deflected beam path on the optical component. The optical system comprises an evaluation unit which is embodied in such a way that a value of the lateral position or angle deflection of the beam deflection unit is determinable on the basis of a longitudinal location of the back-reflection at the optical component determined by the OCT measuring device.

OCT measurement device with back-reflection

A method for measurement of a surface, in particular according to the principle of Optical Coherence Tomography, whereby distances to points of the surface are measured based on interferograms and classifying of measurements as non-valid or valid based on evaluation of phase change or amplitude change of a respective interferogram.

Method for gauging surfaces with classification of measurements as valid or non-valid

A surveying device including a base defining a base axis, a support structure rotatable around the base axis and defining a rotation axis, a light emitting unit emitting light and a light receiving unit for detecting reflected light. A rotation unit is mounted on the support structure for emitting and receiving light in defined directions, wherein the rotation unit comprises a rotation body rotatable around the rotation axis including a scanning mirror arranged tilted relative to the rotation axis. An imaging unit for capturing an image of a scanning region is provided. The imaging unit comprises a camera fixedly arranged on the support structure, the rotation body comprises at least one reflecting deflecting surface assigned to the camera. The imaging unit and the rotation body are arranged so that the field of view comprises a defined field angle around the rotation axis.

Surveying instrument for scanning an object and image acquisition of the object

A machine state monitoring system for recurrently determining a change in static or dynamic properties of a geometry of a machine with positional encoders to derive a coordinate information of at least a first machine portion with respect to a second machine portion, which are movable with respect to one another. The monitoring system includes one calibration-monitoring-unit with an optical, at least two-dimensional measuring location sensing unit which is fixed to the first machine portion and configured to optically sense an at least two dimensional location information of an artifact which is provided at the second machine portion, and temporarily moved into a sensing range for determining the change in the static or dynamic properties of the geometry of the machine by a comparison of multiple of such sensings, the compensation parameters are then updated and is used to derive the coordinate information from the encoders.

Machine geometry monitoring

Light emitting unit, in particular of or for a triangulation-based distance measuring device, for providing defined measuring light, in particular laser light, is disclosed. The light emitting unit comprising a light source for emitting light, in particular a laser light source for emitting laser light, and a beam forming assembly for shaping the light by affecting propagation of the light emitted by the light source, wherein the beam forming assembly is arranged and designed so that measuring light is provided in form of a light line having a midpoint and two opposite ends. The beam forming assembly comprises at least one micro-lens array, the at least one micro-lens array comprises a plurality of micro-lenses, wherein the micro-lenses are designed and arranged in joint manner next to each other with algebraic signs for curvatures of successive micro-lenses being opposite and so that a periodic structure is provided.

Laser module comprising a micro-lens array

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Rorschach, Switzerland

Thomas Jensen