Advanced Micro Devices Corporation

Thomas J Goodwin

Charles E May

Iraj Emami

A method is provided for manufacturing, the method including processing a workpiece in a processing step, detecting defect data after the processing of the workpiece in the processing step has begun and forming an output signal corresponding to at least one type of defect based on the defect data. The method also includes feeding back a control signal based on the output signal to adjust the processing performed in the processing step to reduce the at least one type of defect.

Use of contamination-free manufacturing data in fault detection and classification as well as in run-to-run control

A method is provided for manufacturing, the method including processing a workpiece in a processing step and detecting defect data after the processing of the workpiece in the processing step has begun. The method also includes filtering the defect data using a fractal filter and forming an output signal corresponding to at least one type of defect based on the fractally filtered defect data. The method further includes feeding back a control signal based on the output signal to adjust the processing performed in the processing step to reduce the at least one type of defect.

Fractal filter applied to a contamination-free manufacturing signal to improve signal-to-noise ratios

Various methods of fabricating a reticle are provided. In one aspect, a pattern of opaque structures is formed on a plate capable of transmitting electromagnetic radiation. Adjacently positioned angled surfaces of the opaque structures are identified. Preselected portions of the opaque structures that encompass the adjacently positioned angled surfaces are then removed by ion-beam milling or other methods. Reticle patterns may be customized by modifying the structures of adjacent polygon structures that could otherwise give rise to diffraction-induced patterning errors on resist layers.

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Austin, TX, United States of America

Thomas J Goodwin