Intel Corporation

Freescale Semiconductor,inc.

Nxp Usa, Inc.

Thomas J Birk

Martin M Maxwell

A positioning apparatus includes a support structure, a positioning structure, and a fixture for retaining MEMS devices. A shaft spans between the support structure and the positioning structure, and is configured to rotate about a first axis relative to the support structure in order to rotate the positioning structure and the fixture about the first axis. The positioning structure includes a pair of beams spaced apart by a third beam. Another shaft spans between the pair of beams and is configured to rotate about a second axis relative to the positioning structure in order to rotate the fixture about the second axis. Methodology entails installing the positioning apparatus into a chamber, orienting the fixture into various positions, and obtaining output signals from the MEMS devices to determine functionality of the MEMS devices.

MEMS device positioning apparatus, test system, and test method

A pickup chuck for retaining a semiconductor chip package having electrical contact pads on a surface thereof facing into the pickup chuck. The pickup chuck includes an electrically conductive member for coupling the contact pads to an external electrical device, such as a tester.

Pickup chuck for double sided contact

A pickup chuck which includes a body defining a fluid flow path and a first recess for receiving a semiconductor chip package, at least two chip contact members extending out of the body into the recess, each of which being independently movable in a first direction which is out of the body and in a second direction which is into the body, springs biasing the members into the first direction, flanges limiting movement of each member into the first direction, and one or more heat dissipation fins located within the fluid flow path and engaged with the members to conduct heat therefrom.

Growing community of inventors

Gilbert, AZ, United States of America

Thomas J Birk