Siemens Aktiengesellschaft

Thomas Hankiewicz

Ralf Bitter

Franz Steinbacher

Jan Nygren

Kai-Uwe Pleban

Christoph Wolfgang Marquardt

Piotr Strauch

Frank Probst

Daniel Depenheuer

Adrian Mucha

A method for measuring the concentration of a gas component in a measuring gas. An absorption line of the gas component is varied as a function of the wavelength of the light of a wavelength-tunable light source within a periodically sequential scanning interval. The absorption line of the gas component is modulated with a frequency (f). Modulated light is guided through the measuring gas onto a detector. A measurement signal generated by the detector is demodulated upon determining a harmonic (nf) of the frequency (f). A measurement result is produced by fitting a setpoint curve to the profile of the demodulated measurement signal. Both demodulated measurement signal and setpoint cure are filtered with the aid of the same filter function. The filter function is operative to suppress noise signal components of the demodulated measurement signal that disturb both signal components of the demodulated measurement signal and the setpoint curve.

Method for measuring the concentration of a gas component in a measuring gas

A method for measuring the concentration of a gas component in a measurement gas using a gas analyzer comprises varying the wavelength of the light of a wavelength-tunable light source within periodically consecutive scan intervals for wavelength-dependent scanning of a gas component absorption line of interest. The method also comprises modulating the wavelength of the light of the wavelength-tunable light source with a frequency, guiding the modulated light through the measurement gas onto a detector and demodulating a measurement signal generated by the detector in the event of a harmonic of the frequency. The method further comprises producing a measurement result by fitting a desired curve to the profile of the demodulated measurement signal. A function orthogonal to the desired curve is provided, and an orthogonal component of the measurement result is produced by fitting the orthogonal function to the profile of the demodulated measurement signal.

Method for measuring the concentration of a gas component in a measurement gas

A method in which the wavelength of the light of a tunable light source is varied periodically over an absorption line of interest for the gas component to measure the concentration of a gas component in a measurement gas based on one of two measurement methods of direct absorption spectroscopy and wavelength modulation spectroscopy and, where in the case of wavelength modulation spectroscopy, the wavelength of the light is additionally sinusoidally modulated at a high frequency and with a small amplitude, where the intensity of the light is detected after transradiation of the measurement gas and processed to yield a measurement result, and where in order to increase the accuracy and reliability of the measurement, the two measurement methods are applied simultaneously during each period, or alternately in consecutive periods, and their results are combined by averaging to form the measurement result.

Method for measuring concentration of a gas component in a measurement gas

A laser spectrometer and method for measuring gas component concentration in a measurement gas, wherein light intensity from a wavelength-tunable laser diode is detected after irradiation of the measurement gas and a reference gas, and the concentration of the gas component is determined based on reduction of the light intensity by the absorption of light at the position of a selected absorption line of the gas component, and the position of the absorption line of the gas component is referenced based on a selected absorption line of the reference gas, and wherein there is a mixed operation consisting of actual measurements of fast concentration changes of the gas component to be measured and a short reference/standardization phase for wavelength referencing, line locking and standardization, where the duration of the actual measurement is measured such that measuring conditions remain constant and do not deviate from those during the reference/standardization phase.

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Karlsruhe, Germany

Thomas Hankiewicz