Rohde and Schwarz Gmbh & Co. Kg

Thomas Guenther

Sven Barthel

Michael Boehme

Peter Wagner

The invention relates to a signal analyzer, comprising a signal receiving unit configured to receive a signal, in particular a radio frequency (RF) signal, a digitizing unit configured to digitize the received signal, and a trigger detection unit configured to detect a trigger event in the digitized signal. The signal analyzer further comprises an acquisition unit configured to store a segment of the digitized signal in a memory of the signal analyzer if the trigger detection unit detects the trigger event in the digitized signal, and an anomaly search unit configured to analyze the stored segment of the digitized signal in order to detect signal anomalies, in particular glitches, in the stored segment of the digitized signal.

Signal analyzer

A method of determining a signal histogram having a predetermined number of bins. The method includes: receiving an input signal; decimating the input signal, thereby generating a decimated signal that includes a maximum signal value and a minimum signal value associated with the maximum signal value; assigning the maximum signal value to a maximum bin of a signal histogram; assigning the minimum signal value to a minimum bin of the signal histogram; and filling at least one intermediate bin of the signal histogram with an intermediate value, wherein the intermediate bin is located between the minimum bin and the maximum bin in the signal histogram.

Method and signal processing circuit for determining a signal histogram

The disclosure relates to a test and measurement instrument. The test and measurement instrument comprises a digitizer for digitizing an analog input signal, thereby generating a digitized input signal. The test and measurement instrument also has a digital trigger for detecting a trigger event in the digitized input signal. The test and measurement instrument also comprises an acquisition memory for acquiring the digitized input signal at least segmentally upon a first trigger event detected by the digital trigger. The acquisition memory is configured to acquire a first signal segment prior to the first trigger event. The acquisition memory is further configured to acquire a second signal segment starting at the first trigger event. The length of the second signal segment is dynamically adjustable. Moreover, a method of analyzing an input signal by a test and measurement instrument is described.

Test and measurement instrument and method of analyzing an input signal

A method for analyzing a measured signal is described wherein at least a first segment and a second segment of said measured signal are acquired by a measurement device. At least said first segment and said second segment are stored in an acquisition memory of said measurement device. A search criterion is applied on at least said first segment and said second segment. At least a first timing event corresponding to said search criterion is stored into a memory, said first timing event being found in at least one of said segments. Further, an oscilloscope is described.

Method for analyzing a measured signal and oscilloscope

A measuring device comprises a first interface, which is adapted to receive a first measuring signal. The measuring device further comprises an acquisition memory, which is adapted to store at least one data segment of the first measuring signal. The measuring device further comprises an analyzer, which is connected to the acquisition memory, and is adapted to analyze the at least one data segment of the first measuring signal and generate a first analysis result therefrom. The measuring device further comprises a memory controller, which is adapted to either keep, in the acquisition memory, or discard, the at least one data segment based upon the first analysis result.

Measuring device and measuring method with selective storage of data segments

Methods for analyzing a measured signal, and a measurement unit for carrying out these methods, are provided. The method includes, acquiring at least a first segment and a second segment of the measured signal by a measurement unit; storing the at least a first segment and a second segment in an acquisition memory of the measurement unit; applying a filter on the at least a first segment and a second segment; and storing at least one segment of the at least a first segment and a second segment that corresponds to the filter into at least one of a display memory and a processor memory of the measurement unit.

Method for analyzing a measured signal as well as measurement unit

A signal analyzing circuit is described, with at least a first channel, the first channel comprising a digitizer configured to digitize an input signal into a time-and-value-discrete signal; a switching unit coupled to the digitizer, the switching unit being adapted to receive the time-and-value-discrete signal and an acquisition memory coupled to the switching unit. The switching unit is adapted to selectively activate a decimator unit in a time-domain operation mode, the decimator unit decimating the time-and-vale-discrete signal to a decimated time-and-value-discrete signal or a digital down converter unit in a spectrum view operation mode, the digital down converter unit down-converting the time-and-value-discrete signal to a down-converted time-and-value-discrete signal. The aid acquisition memory is coupled to the decimator unit in the time-domain operation mode to store the decimated time-and-value-discrete signal, the acquisition memory being not coupled to the digital down converter unit in the time-domain operation mode. The acquisition memory is coupled to the digital down converter unit in the spectrum view operation mode to store the down-converted time-and-value-discrete signal, the acquisition memory being not coupled to the decimator unit in the spectrum view operation mode. In addition, an oscilloscope and a method for auto setting an oscilloscope are described.

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Waldenburg, Germany

Thomas Guenther