Analog Devices International Unlimited Company

Thomas G O'Dwyer

Alan J O'Donnell

Edward John Coyne

David J Clarke

David Aherne

Shaun Bradley

David M Boland

Colm Patrick Heffernan

Mark Forde

Kevin B Manning

Michael A Looby

Alfonso Berduque

Helen Berney

David Boland

Michael Looby

Alan J O'DONNELL

The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.

Lifetime indicator system

An integrated ion-sensitive probe is provided. In an example, an ion-sensitive probe can include a semiconductor substrate and a first passive electrode attached to the semiconductor substrate. The first passive electrode can be configured to contact a solution and to provide a first electrical voltage as function of a concentration of an ion within the solution. In certain examples, a passive reference electrode can be co-located on the semiconductor substrate. In some examples, processing electronics can be integrated on the semiconductor substrate.

Integrated ion sensing apparatus and methods

Exposure monitor device

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Arlington, MA, United States of America

Thomas G O'Dwyer