Analog Devices,inc.

Analog Devices Global

Analog Devices International Unlimited Company

Analog Design Services Limited

Thomas G O'Dwyer

Alan J O'Donnell

Edward John Coyne

David J Clarke

David Aherne

Colm Patrick Heffernan

Mark Forde

Kevin B Manning

Michael A Looby

Dennis A Dempsey

Shaun Bradley

David M Boland

Tudor M Vinereanu

Oliver James Brennan

Alan Walsh

Stefan Marinca

Colin Gerard Lyden

Xin Zhang

Patrick Martin McGuinness

William Allan Lane

Tze Lei Poo

Javier Calpe Maravilla

John Jude O'Donnell

Isaac Chase Novet

Gaurav Vohra

Helen Berney

Venugopal Gopinathan

Stephen A Cohen

Christopher W Hyde

James E Scarlett

YounJae Kook

Helen Stapleton

The disclosed technology generally relates to integrated circuit devices with wear out monitoring capability. An integrated circuit device includes a wear-out monitor device configured to record an indication of wear-out of a core circuit separated from the wear-out monitor device, wherein the indication is associated with localized diffusion of a diffusant within the wear-out monitor device in response to a wear-out stress that causes the wear-out of the core circuit.

Exposure monitor device

Reference circuits are described. In particular reference circuits that use a plurality of cascaded proportional to absolute temperature, PTAT, cells are described. In the circuits disclosed, currents of the low current density arm of first PTAT cell are mirrored into the high current density arms of a second PTAT cell such that any deviation of current in the low current density arm of the first cell will be replicated as the current in the high current density arm of the second cell. In this way low noise circuits can be provided.

Low noise reference circuit

An impedance measurement system for detecting an analyte in a sample is disclosed. The system includes first, second, and third electrodes, wherein at least a portion of the third electrode is positioned between the first and second electrodes, means for generating an electromagnetic field between the first and second electrodes, means for electrically controlling the third electrode, wherein the third electrode modifies the electromagnetic field, and a processor for detecting a presence of the analyte in the sample, based at least in part on a property of the electromagnetic field.

Impedance measurement in diagnostic testing

Wear-out monitor device

A blood oxygenation sensor is provided comprising: a first current-powered light source to produce light having a first wavelength; a second current-powered light source to produce light having a second wavelength; a light sensor to produce a current signal having a magnitude that is indicative of intensity of light incident upon it; a current level driver circuit that includes a current source configured to couple the current source to alternatively provide current to one of the first current-powered light source and the second light current-powered light source; a processor configured to predict times of occurrence of one or more first time intervals in which arterial volume at a tissue site is at one of a maximum and a minimum; wherein the processor is configured to control the current source, to provide a first pattern of higher power-dissipation current pulses to the first and second current-powered light sources during the first time intervals, and to provide a second pattern of lower power-dissipation current pulses to at least one of the first and second current-powered light sources during second time intervals.

Blood oxygenation sensor with LED current modulation

According to various aspects, systems and methods for providing a soft-decoding physical unclonable function are provided. According to one embodiment, PUF circuitry includes circuit elements with impedance values that are used to generate a PUF value. For example, one or more resistors may be connected to a voltage source. The resistors may generate a resulting voltage signal that is measured and indicates a ratio of the impedance values of the resistors. Due to manufacturing variations, each impedance value may be unique, such that the impedance values may be used to provide a unique number sequence. Each ratio value may be converted into a single bit or multi-bit digital value through digitization, for example with a comparator and/or an analog to digital converter, and the series of digital values may represent or be used to generate a unique number sequence.

Impedance-based physical unclonable function

The disclosed technology generally relates to integrated circuit devices with wear out monitoring. An integrated circuit device includes a core circuit and a wear-out monitor device. The wear-out monitor device configured to adjust an indication of wear out of the core circuit regardless of whether the core circuit is activated The integrated circuit further includes a sensing circuit coupled to the wear-out monitor device and configured to detect an electrical property of the wear-out monitor device that is indicative of a wear-out level of the core-circuit.

An integrated ion-sensitive probe is provided. In an example, an ion-sensitive probe can include a semiconductor substrate and a first passive electrode attached to the semiconductor substrate. The first passive electrode can be configured to contact a solution and to provide a first electrical voltage as function of a concentration of an ion within the solution. In certain examples, a passive reference electrode can be co-located on the semiconductor substrate. In some examples, processing electronics can be integrated on the semiconductor substrate.

Integrated ion sensing apparatus and methods

Various methods and systems are provided to control a probe moving towards fluid held in a container. The probe is moved towards the fluid to take a sample of the fluid in the container. To take a sample, probe is actuated to hit the fluid surface and to pass the fluid surface by a predetermined distance. Capacitive sensing which incorporates the probe itself is used to support an approach engine for controlling the motion of the probe. The approach engine determines the speed of the probe based on capacitance measurements, and in some cases based on position information of the probe. The approach engine ensures the probe hits the surface of the fluid in the container in order to take a sample while ensuring the probe does not hit the bottom of the container.

Capacitive sensing probe motion control system

The present invention provides a method and apparatus for compensating for temperature effects in the operation of semiconductor processes circuitry, such as reference circuits. The method operates on the realization that the second order effects such as 'curvature' in the reference voltage variation over a temperature range is removed. The reference voltage variation over a temperature range can be represented as a straight line. This method provides for the trimming of the absolute voltage by scaling the reference voltage at a first temperature to the desired value by a temperature independent voltage. Then, at a second temperature, the output voltage slope is corrected by adding or subtracting a voltage which is always zero at the first temperature.

Method and apparatus for compensating for temperature drift in semiconductor processes and circuitry

An integrated circuit for automatic calibration control of pin electronics is disclosed. The integrated circuit includes a substrate, and both pin electronics and a calibration circuit integral with the substrate. The calibration circuit is dedicated to a single channel of automatic testing equipment for a single pin of a device under test. Each sub-circuit of the pin electronics may include a replica output. The replica output is electrically coupled to the calibration circuit. The calibration circuit may include a multiplexor for receiving each of the replica outputs from the sub-circuits, such as a comparator, load and a driver, and for selectively switching between the replica outputs to determine calibration parameters for one or more levels of the sub-circuit. The calibration circuit includes a state machine capable of determining calibration parameters including offset and gain. After determining the calibration parameters, the state machine can compensate the one or more levels for each sub-circuit of the pin electronics based upon the calibration parameters.

Calibration control for pin electronics of automatic testing equipment

The present invention relates to a system and method for digitally compensating signal converters and in particular a digital to analog converter which receives digital input data for a digital to analog converter and supplies anti-function digital coefficients derived from the error function of the digital to analog converter and corresponding to the digital input data and applies the anti-function digital coefficients to the digital input data to pre-condition the digital input data to compensate for the error function of the digital to analog converter. The invention also extends to analog to digital converters.

System and method for digital compensation of digital to analog and analog to digital converters

The present invention provides an improved Digital to Analog Converter (DAC) of the switched dual string DAC type, which saves on chip surface area, reduces the number of resistors and implementation cost, reduces the self capacitance and the device leakage currents of the circuit elements. The invention provides a guaranteed monotonic DAC architecture, which comprises a switching network for creating three states at a DAC transition node. In one embodiment the invention provides an unloaded state wherein a LSB DAC is de-coupled from a MSB DAC wherein the node between neighboring MSB DAC resistors is coupled to the DAC output. One of the advantages of creating the unloaded state is that the number of LSB DAC resistors is reduced as is normally the case in the prior art for a similar application.

Digital to analog converter

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Clonlara, Ireland

Thomas G O'Dwyer