Acterna Eningen Gmbh

Wavetek Wandel Goltermann Eningen Gmbh & Co.

Wavetek Wandel Goltermann Eningen Gmbh

Thomas Fuhrmann

Wolfgang Schmid

Eberhard Lothar Loecklin

Michael Pahlke

Andreas Conzelmann

Karl Benzel

Klaus Steininger

An optical spectrometer comprises at least two coupling apertures with different mode field diameters, a means for dispersing the light beams exiting each of the coupling apertures along a dispersion axis and at least two decoupling apertures on which the dispersed light beams are imaged and whose mode field diameters each correspond to the mode field diameters of the associated coupling apertures. Due the enlarged mode field diameter, a larger spectral fraction of dispersed light beams, i.e., light of a larger spectral bandwidth, can be coupled into the decoupling aperture than into the decoupling aperture.

Optical spectrometer with several spectral bandwidths

In a light waveguide, the one end of which comprises a flat entering area for the light to be coupled into the core of the light waveguide, the entering area is narrower than the core diameter of the light waveguide and, around the entering area, the end of the light waveguide is laterally sloped up to the entering surface. Only the light which impinges on this entering area passes into the core and is guided therein.

Light waveguide with integrated input aperture for an optical spectrometer

An optical spectrum analyzer of novel design, in which several different spectra can be measured and analyzed simultaneously. A measuring signal is used as a reference signal for calibrating the optical spectrum analyzer. The light rays are admitted via a coupling device with several coupling apertures arranged in a line; and via a separate decoupling device comprising respective decoupling apertures arranged in a line, the light rays are decoupled. Height offset is realized by a 90&deg; deviation prism. The arrangement makes possible simultaneous analysis of several optical lines with little retroreflection as well as uninterrupted calibration of the measuring process.

Arrangement for simultaneous analysis of several optical lines

In an optical spectrum analyzer, the respective wavelength bandwidths of the optical spectrum analyzer are determined at the wavelengths of the reference lines and used as calibration data for determining measurement tolerances by means of reference lines of known wavelength and known wavelength bandwidths from the known wavelength bandwidths of the reference lines and from the wavelength bandwidths of the reference lines measured with the optical spectrum analyzer

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Eningen, Germany

Thomas Fuhrmann