Rohde and Schwarz Gmbh & Co. Kg

Thomas Fischer

Sherif Sayed Ahmed

Christian Evers

Frank Gumbmann

Tobias Koeppel

Michael Freissl

Tobias Köppel

A measurement setup for measuring attenuation through an irregular surface of a device under test is described. The measurement setup includes a positioning system, a reference reflector, and a three dimensional imaging system. The measurement setup has a reference state and a measurement state, wherein respective images are taken in the different states. The imaging system is configured to compare the images taken in the reference state and the measurement state to determine the attenuation of the device under test. Further, a reference reflector as well as a method for measuring attenuation are described.

Measurement setup, reference reflector as well as method for measuring attenuation

A measurement setup for measuring attenuation through an irregular surface of a device under test is described. The measurement setup comprises a positioning system, a reference reflector having a collection of diffuse scattering members, and a three dimensional imaging system. The measurement setup has a reference state and a measurement state, wherein respective images are taken in the different states. The imaging system is configured to compare the images taken in the reference state and the measurement state to determine the attenuation of the device under test. Further, a reference reflector as well as a method for measuring attenuation are described.

Growing community of inventors

Puchheim, Germany

Thomas Fischer