U.S. Natural Resources, Inc.

Thomas E Lock

James N Horn

Gordon L Mitchell

Jon F Soest

A scanning system for wood products to detect grain defects and product geometry simultaneously. Multiple scanner sets cast parallel beams of light at an angle of incidence in a plane that is normal to the surface of the wood product. Scanner sets are provided to scan both the top and bottom surfaces of the wood product. The scanner sets include detector arrays to detect the reflected light of the beams off the surface of the product. One array of each set is positioned strategic to the angle of incidence and another is positioned strategic to the angle of specular reflection. The magnitudes of the detector are compared to determine clear wood or grain defect. The time of detection is used to calculate thickness/geometry.

Growing community of inventors

Woodinville, WA, United States of America

Thomas E Lock