Lawrence Livermore National Security, LLC

National Technology & Engineering Solutions of Sandia, LLC

Sandia National Laboratories

University of California

Sandia Corporation

Thomas E Felter

Sergei Kucheyev

Jeffrey Colvin

Marcus A Worsley

Patrick G Campbell

Matthew Merrill

Sangil Kim

Christine A Orme

Michael Bagge-Hansen

Supakit Charnvanichborikarn

Joseph Collin Farmer

Joe H Satcher, Jr

Larry E Fischer

Douglas Ohlberg

Ronald G Musket

Joe Satcher

Lawrence S Pam

Sung Han

Ciaran Fox

Alec Talin

Disclosed here is a method for making a nanoporous material, comprising aerosolizing a solution comprising at least one metal salt and at least one solvent to obtain an aerosol, freezing the aerosol to obtain a frozen aerosol, and drying the frozen aerosol to obtain a nanoporous metal compound material. Further, the nanoporous metal compound material can be reduced to obtain a nanoporous metal material.

Porous materials via freeze-casting of metal salt solutions

Described here is a metal-carbon composite, comprising (a) a porous three-dimensional scaffold comprising one or more of carbon nanotubes, graphene and graphene oxide, and (b) metal nanoparticles disposed on said porous scaffold, wherein the metal-carbon composite has a density of 1 g/cmor less, and wherein the metal nanoparticles account for 1 wt. % or more of the metal-carbon composite. Also described are methods for making the metal-carbon composite.

Nanoporous metal-carbon composite

A system for indirectly detecting a radiation source by directly detecting radiolytic products. The radiation source emits radiation and the radiation produces the radiolytic products. A fluid is positioned to receive the radiation from the radiation source. When the fluid is irradiated, radiolytic products are produced. By directly detecting the radiolytic products, the radiation source is detected.

Indirect detection of radiation sources through direct detection of radiolysis products

An improved quadrupole mass spectrometer is described. The improvement lies in the substitution of the conventional hot filament electron source with a cold cathode field emitter array which in turn allows operating a small QMS at much high internal pressures then are currently achievable. By eliminating of the hot filament such problems as thermally &ldquo;cracking&rdquo; delicate analyte molecules, outgassing a &ldquo;hot&rdquo; filament, high power requirements, filament contamination by outgas species, and spurious em fields are avoid all together. In addition, the ability of produce FEAs using well-known and well developed photolithographic techniques, permits building a QMS having multiple redundancies of the ionization source at very low additional cost.

Method for analyzing the mass of a sample using a cold cathode ionization source mass filter

Miniature quadrupole mass spectrometer having a cold cathode ionization source

Nanometer-size wires having a cross-sectional dimension of less than 8 nm with controllable lengths and diameters are produced by infiltrating latent nuclear or ion tracks formed in trackable materials with atomic species. The trackable materials and atomic species are essentially insoluble in each other, thus the wires are formed by thermally driven, self-assembly of the atomic species during annealing, or re-crystallization, of the damage in the latent tracks. Unlike conventional ion track lithography, the inventive method does not require etching of the latent tracks.

Formation of nanometer-size wires using infiltration into latent nuclear tracks

This method produces a field emitter material having a uniform electron emitting surface and a low turn-on voltage. Field emitter materials having uniform electron emitting surfaces as large as 1 square meter and turn-on voltages as low as 16V/.mu.m can be produced from films of electron emitting materials such as polycrystalline diamond, diamond-like carbon, graphite and amorphous carbon by the method of the present invention. The process involves conditioning the surface of a field emitter material by applying an electric field to the surface, preferably by scanning the surface of the field emitter material with an electrode maintained at a fixed distance of at least 3 .mu.m above the surface of the field emitter material and at a voltage of at least 500V. In order to enhance the uniformity of electron emission the step of conditioning can be preceeded by ion implanting carbon, nitrogen, argon, oxygen or hydrogen into the surface layers of the field emitter material.

Processing of materials for uniform field emission

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Livermore, CA, United States of America

Thomas E Felter