Beckman Coulter, Inc.

Thomas E Domack

Santos E Vargas

Microscope slide

An apparatus for selectively holding and releasing an object in an analysis system is set forth. The apparatus comprises first and second arm assemblies that are mounted for rotation about a corresponding pair of axes. Each arm assembly includes an object holding end and a magnetic end disposed opposite one another about the respective axis. A magnetic drive is provided to magnetically induce rotation of the magnetic ends of the first and second arm assemblies about their respective axes between an open state in which the holding ends are distal one another to allow placement of the object that is to be held therebetween and a closed state in which the holding ends are driven proximate the object. The apparatus may be readily adapted to receive and hold a variety of objects, such as test tubes, vials, microscope slides, etc.

Apparatus for selectively holding and releasing an object in an analysis system

A slide ejector mechanism for automatically removing a slide from a slide stack is set forth. The slide ejector mechanism comprises an ejector blade adapted to engage a longitudinal edge of the slide and an ejector drive. The ejector drive is connected to rotate the ejector blade through a curved ejection path. During this rotation, the ejector blade engages the longitudinal edge of the slide to remove the slide from the slide stack and place the slide at an output position for subsequent manipulation. In accordance with a further enhancement, the slide ejector mechanism may include structures that render the apparatus self-cleaning of broken slides. Such structures may include a platen having an opening therethrough along at least a portion of the ejection path. The opening has a width that is slightly less than a length of the slide so that the slide spans the opening and is supported at its edges by the platen.

Slide ejector mechanism suitable for use in a laboratory instrument

An apparatus for analyzing a population of particles is set forth. The apparatus includes an emitter adapted to generate a beam of electromagnetic radiation, such as from a laser, and a particle chamber disposed in a path of the electromagnetic radiation beam. The apparatus also includes a sensor to detect electromagnetic radiation scattered by or otherwise received from the particle chamber. A sensor alignment unit supports the sensor along a detection axis and allows adjustment of the position of the sensor along orthogonal axes lying in a plane that is generally perpendicular to the detection axis. In one embodiment, the sensor alignment unit includes a first support platform and a first adjustment mechanism disposed to adjust the position of the first support platform along a first orthogonal axis. The sensor alignment unit also includes a second support platform that supports the sensor. The second support platform is connected to the first support platform in such a manner as to allow the second support platform to move along a second orthogonal axis. A second adjustment mechanism is provided to adjust the position of the second support platform with respect to the first support platform along the second orthogonal axis. In this manner, the position of the sensor can be adjusted to optimize detection of the desired particle characteristics.

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Miami, FL, United States of America

Thomas E Domack