Siemens Aktiengesellschaft

Thomas Baudisch

Francesco Montrone

Jörn Peschke

Maximilian Metzner

Ulrich Rossgoderer

A method, device for identifying causes of faults in automated systems and an automated system which forms the device for identifying causes of faults in automated systems, wherein within a digital twin of the automated system, at least one element of the digital twin is assumed to be faulty and then simulated using the digital twin until a fault time, and where at least one faulty element of the automated system is identified as the cause of a fault based on the at least one element assumed to be faulty.

Method and device for efficient fault analysis through simulated faults in a digital twin

A method and apparatus for determining differences between an automated installation and a digital twin of the automated installation and to an automated installation that includes the apparatus, wherein a sensor unit is fastened to a process material and passes through an automated installation together with the process material where, during this process, the sensor unit continuously records at least one measurement variable, a temporal profile of the recorded measurement variable is compared with a temporal profile of a corresponding simulated measurement variable and if there is a difference between the temporal profiles, then the location in the automated installation at which the difference is present is identified.

Apparatus and method for identifying differences between a real installation and a digital twin of the installation

A method and an apparatus for automatically generating a target simulation model for a defined simulation object, provides artifacts of the simulation object in a data base; extracts the information needed for generating the target simulation model from the artifacts; maps the object elements based on the defined objective into the elements of the target simulation model; and assembles the extracted information and the mapped elements to generate the target simulation model. The artifacts describe the structure, the behavior, and the physics of the object elements with mechatronics simulation tags representing implicit indirect engineering information not extracted automatically by a tool.

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Bayern, Germany

Thomas Baudisch