Cisco Technology, Inc.

Thomas A Hamilton

Marco De Angeli

Roberto Gianella

Jun Qian

Senthil Somasundaram

Marco Portinari

Paul S Chang

Mehran Ataee

Udupi Harisharan

Loc Thi Xuan Dang

Gregory Dupree

Steven Lowe

Stephen R Rumbaugh

A method and apparatus to regulate voltage used to power an ASIC comprising an ASIC having a signal source and a modulator. The modulator establishes a characteristic of a signal created by the signal source to indicate a voltage level to be used to power the ASIC. The signal is communicated to a voltage regulator to apply an optimal voltage to the ASIC.

Interface to regulate voltage for ASIC power management

Systems, methods, and other embodiments associated with programmable application specific integrated circuit (ASIC) fault injection are described. One example ASIC includes a serializer de-serializer (SERDES). The example ASIC may also include logics to process data in the ASIC. At least one of the logics either receives data from the SERDES and/or provides data to the SERDES. The example ASIC may also include an embedded fault injection logic (EFIL) to control injection of a fault to a path (e.g., data, control) associated with at least one of the logics. The example ASIC may also include an embedded set of multiplexers (ESOMs) controlled by the EFIL. The ESOMs are controllable by the EFIL to inject a fault signal to the data path.

Fault injection

Systems and methods for employing asynchronous transceivers in synchronous data communications. For example, a 10 Gigabit Ethernet transceiver may be used to support SONET/SDH communications with or without G.709 coding. Such a transceiver is clocked with a recovered clock signal when a received synchronous signal is available and with a locally generated clock when no such remotely generated signal is available.

Recoverable reference clock architecture for SONET/SDH and ethernet mixed bidirectional applications

A printed circuit board (PCB) may be used in a first mode where boundary scan techniques are used to externally program and/or test devices on the PCB, or a second mode where an internal source programs devices using boundary scan techniques. In one implementation, there is also additional flexibility to include or skip devices in a boundary scan chain and to accommodate non-scan related functions for pins used for scanning. These various modes of operation may be selected by activating and deactivating buffers.

JTAG and boundary scan automatic chain selection

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Milpitas, CA, United States of America

Thomas A Hamilton