Friedrich-Alexander-Universitat Erlangen-Nürnberg

Siemens Aktiengesellschaft

Ion Beam Applications S.a.

Czech Technical University in Prague

European Organization for Nuclear Research (Cern)

Cern—european Organization for Nuclear Resesarch

Cern-European Organization for Nuclear Research

European Organization for Nuclear Research

Thilo Michel

Daniel Niederlöhner

Gisela Anton

Thomas Weber

Michael Campbell

Jürgen Durst

Jens Rieger

Georg Pelzer

Florian Bayer

Peter Bartl

Lukas Tlustos

Markus Firsching

Winnie Sze-Wing Wong

Michael Böhnel

Ernst Fritsch

Jan Jakubek

Karl Lehi Schwartz

Xavier Llopart Cudie

Rafael Ballabriga Suñe

Uwe Mollenhauer

Alexander Korn

Karl L Schwartz

Rafael Ballabriga SUÑE

A method, for examining an object using an X-ray recording system, includes aligning the object in the X-ray beam and the X-ray recording system with one another such that regions in the X-ray beam are uncovered for measurement of a free field. During an X-ray image recording, the components are moved relative to one another with a lateral displacement. In a position of the relative lateral displacement of the components, a reference image containing free fields is recorded. The X-ray image recording is generated from partial images during the displacement and the position of the second component relative to the first component is determined for each partial recording such that the displacement distances of the displacements and the reference phases are calculated from a selected set of pixels and the measured intensity values thereof. Finally, the image information is determined from the partial images, the displacements and the reference phases.

Method for examining an object using an X-ray recording system for phase contrast imaging with displacement measurement

A method, for examining an object using an X-ray recording system, includes during an X-ray image recording, moving components relative to one another with the lateral displacement by displacement distances. The method includes generating the X-ray image recording during the displacement from n partial images, so that the total exposure time of the X-ray image recording is made up from a sum of partial exposure times. In each of the partial images, the intensity is determined in each pixel. The position of the second component relative to the first component is determined for each recording of the partial images. Finally, the image information is determined from the partial images and the displacements.

Method for examining an object using an X-ray recording system for phase contrast imaging with stochastic phase scanning

The present invention relates to a pixel detector (), comprising a semiconductor sensor layer (), in which charges can be generated upon interaction with particles to be detected. The semiconductor layer defines an X-Y-plane and has a thickness extending in Z-direction. The detector further comprises a read-out electronics layer () connected to said semiconductor layer (), said read-out electronics layer () comprising an array of read-out circuits () for detecting signals indicative of charges generated in a corresponding volume of said semiconductor sensor layer (). The neighboring read-out circuits () are connected by a relative timing circuit configured to determine time difference information between signals detected at said neighboring read-out circuits (). The time difference information is indicative of a difference in the Z-components of the locations of charge generations in the corresponding neighboring sensor volumes caused by a particle trajectory that is inclined with respect to the X-Y-plane.

Single layer 3D tracking semiconductor detector

Radiation detector for measuring one or more characteristics of a radiation, comprising one or more detector pixels, a clock pulse generator, each detector pixel comprising a sensor producing an electrical signal in response to an event of a photon or charged particle of said radiation impinging on said sensor; a pixel electronics adapted for receiving and processing said electrical signal, comprising an analog processing unit for amplifying and shaping said electrical signal and producing a shaped pulse said pixel electronics comprises time determination unit for counting the TOT-count, the TOT-count being the number of clock pulses occurring during the time interval when said shaped pulse is above a threshold. Said pixel electronics comprises a plurality of event counters, each event counter counting the number of events having a TOT-count in a predefined ranges.

Radiation monitoring device

A detector arrangement is disclosed for performing phase-contrast measurements, including at least two transducer layers arranged one behind the other, wherein at least the first transducer layer arranged in the radiation direction includes alternate sensitive areas having a high absorptance for the conversion of incident radiation quanta into signals and less sensitive areas having a lower absorptance in comparison thereto. Further, a corresponding X-ray tomography device and a method for performing phase-contrast measurements are also enclosed.

Detector arrangement and X-ray tomography device for performing phase-contrast measurements and method for performing a phase-contrast measurement

The present invention relates to a device and method for determining one or more characteristics of radiation using a sensor comprising one or more detector units capable of counting the number of photon or charged particle of said radiation impinging on said sensor in or above a determined energy range.

Method and apparatus for determining one or more characteristics of radiation

A photon detector has a photocathode for the photon-induced triggering of measuring electrons. Spatial position information is supplied by an at least one-dimensional electron-detector pixel array. An electron optics unit serves for guiding the measuring electrons to the array. Each pixel () has an electronic converter unit () for converting an analog measuring signal of the pixel () into a digital measuring signal, which incorporates a discriminator for background suppression. An electronic post-processing unit () serves for processing the digital measuring signal. The converter unit () of each pixel () has at least one clock generator (), as well as at least one counter (), which is in signal connection with the clock generator () and discriminator () for generation of a digital timing signal. The timing signal is such that itfrom the number of clock cycles between a time-reference point and the moment (t) of the arrival of an analog measuring signal not suppressed by the discriminator (). The result is a photon detector in which not only the position information can be derived from the measuring signal but additionally also the information when the measuring signal was triggered at the given pixel.Translator's note: This transition is based on an incomplete German-language sentence.

Photon detector for photon-induced triggering of measuring electrons

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Nürnberg, Germany

Thilo Michel