International Business Machines Corporation

Thilo Hermann Stoeferle

Armin W Knoll

Urs T Duerig

Rainer Friedbert Mahrt

Fei Ding

Kristian Samuel Cujia Pena

Jonas R Weiss

Roger F Dangel

Ute Drechsler

Embodiments are notably directed to a vertical microcavity. The vertical microcavity includes a first reflector and a second reflector, each of which includes one or more material layers extending perpendicular to a vertical axis x. The cavity may further include a confinement region extending between the first reflector and the second reflector, so as to be able to confine an electromagnetic wave. The confinement region may include a single layer material, which is structured so as to create an effective refractive index variation for the electromagnetic wave to be confined, in an average plane of the single layer material, perpendicularly to said vertical axis x. Additional examples are further directed to related microcavity systems and methods of fabrication.

Vertical microcavity with confinement region having sub-wavelength structures to create an effective refractive index variation

A method of fabrication of a micro-optics device included providing a layer of material; patterning the layer of material by one or more of: locally unzipping and desorbing molecules thereof, with a nano-scale dimensioned probe, to obtain a curved surface for the layer of material, the curved surface having a curved profile in a plane section; and completing a layer structure perpendicular to the plane section by providing one or more additional layers of material in contact with the curved surface to obtain the micro-optics device, wherein the micro-optics device has the layer structure, with a given layer thereof comprising a defect delimited by two surfaces, wherein one of the two surfaces is the curved surface.

Fabrication of a micro-optics device with curved surface defects

An atomic-force microscope system is provided including: an electrically conducting cantilever support; an electrically insulating element; and an electrically conducting cantilever anchored at a first end to the cantilever support via the insulating element, the cantilever including a probe tip at a second end opposite to the first end and the cantilever support is configured as a backside electrode of the cantilever for backside actuation thereof; a Fabry-Perot interferometer including: a resonator with a first mirror defined on the cantilever; and a second mirror defined on the cantilever support having a first side and a second side configured to allow light injection, opposite to the first side, the latter extending at least partly vis-&#xe0;-vis the first mirror. The interferometer includes a light-emitting device, and a detector configured for detecting a property of the system impacted by interferences of light emitted by the light-emitting device. Methods of operations are also provided.

Atomic-force microscope system with integrated fabry-perot resonator

An electromagnetic wave resonator comprising a body, wherein the body: has a structure extending essentially in a plane (r, &#x3b8;), comprises a material in a region between limit radii rand r, where 0&#x2266;r&#x3c;rand rcorresponds to a radius of a convex hull () of the structure; and allows for electromagnetic wave propagation, and wherein an effective refractive index n(r), as obtained from angularly averaging a refractive index of the material in the plane (r, &#x3b8;), decreases within said region.

Electromagnetic wave resonator with effective refractive index gradient

A vertical microcavity having a layer structure perpendicular to a vertical axis z, includes a first reflector and a second reflector, each comprising one or more material layers; a confinement layer between the reflectors, wherein an electromagnetic wave can be substantially confined, the confinement layer having a body and a defect delimited by first and second surfaces, perpendicular to the vertical axis z; wherein one of the two surfaces is contiguous with the body, the other one contiguous with a layer of the first or second reflector, and wherein one of the two surfaces has a curved profile in at least a plane section perpendicular to the layer structure, the curved profile having a vertex, which defines a maximal thickness hof the defect between the first surface and the second surface in the plane section, the maximal thickness hbeing less than a thickness of the contiguous layer.

Vertical microcavity with curved surface defects

A polymer waveguide including a polymer matrix and particles, wherein the particles are embedded in the polymer matrix and have lower optical bulk losses than the polymer matrix.

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Rueschlikon, Switzerland

Thilo Hermann Stoeferle