Saint-gobain Glass France

Thierry Kauffmann

Yohan Faucillon

Xavier Caillet

Bernard Nghiem

Gregoire Mathey

Jean Lorenzzi

Etienne Sandre-Chardonnal

Julien Beutier

Vojislav Gajic

Elsa-Marie Perrin

Yaël Bronstein

Jean Carlos Lorenzzi

A computer implemented methods for estimating at least one quality function of a given layered coating on a transparent substrate allows to predict at least one non in-process measured quality function of a given layered coating on a transparent substrate from an in-process measured quality function which can be acquired on the coated substrate as deposited at any location, preferably at the end of a coating process. The method allows to get rid of in-process real-time continuous measurements of quality functions of the coated transparent substrate and real-time monitoring of coating process parameters.

Method for estimating a quality function of a mono- or multi-layered coated transparent substrate

An adjustment-determining method includes obtaining a mathematical model relating an operating parameter of the deposition line to a quality function defined from a quality measurement of a stack of thin layers deposited by the deposition line on a transparent substrate; obtaining a value of the quality function from a value of the quality measurement measured at the outlet of the deposition line on a stack of thin layers deposited by the deposition line on a substrate while the deposition line was set so that an operating parameter had a current value; and automatically determining by the mathematical model an adjustment value for the current value of the operating parameter serving to reduce a difference that exists between the value obtained for the quality function and a target value selected for the quality function for the stack of thin layers.

Method and a device for automatically determining adjustment values for operating parameters of a deposition line

A method for locating, in a deposition line including a succession of compartments, an origin of a defect affecting a stack of thin layers deposited on a substrate in the compartments, in which each thin layer is deposited in one or more successive compartments of the deposition line and pieces of debris remaining on the surface of a thin layer deposited in a compartment act as masks for the subsequent depositions of thin layers and are the origin of defects, includes obtaining at least one image showing the defect, determining, from the at least one image, a signature of the defect, the signature containing at least one characteristic representative of the defect, and identifying at least one compartment of the deposition line liable to be the origin of the defect from the signature of the defect and using reference signatures associated with the compartments of the deposition line.

Method and device for locating the origin of a defect affecting a stack of thin layers deposited on a substrate

A material includes a transparent substrate coated with a stack of thin layers successively including, starting from the substrate, an alternation of three silver-based functional metallic layers and of four dielectric coatings, so that each functional metallic layer is positioned between two dielectric coatings. The thicknesses of the three functional layers and the thicknesses of the dielectric coatings are selected in order to give the materials solar factor values of less than 20% for a light transmission of the order of 40%.

Substrate provided with a stack having thermal properties

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Paris, France

Thierry Kauffmann