Handy + Harman

Rika Electronics International, Inc.

Theresa R Souza

Allen E Molvar

Larre H Nelson

A probe plunger and method of making are provided. The probe plunger includes an outer layer of a relatively hard, relatively low contact resistance such as a palladium-cobalt alloy. In some embodiments, a portion of the exterior surface includes at least one region of a self-limiting oxide.

Electrical test probes and methods of making the same

The present invention relates to composite articles including a surface layer of tin, lead, silver or an alloy thereof that contains co-deposited non-ionic polymeric particles to provide a reduced-friction deposit that has an initially low coefficient of friction and low insertion force and fretting corrosion in separable electronic connectors, and to methods for preparing the plated articles. The polymeric particles have a size between about 0.1 to 0.45 .mu.m in diameter to reduce the coefficient of friction of the resultant deposit to about 0.45 or below. Also, the deposit has excellent electrical properties and can be successfully soldered. The invention also relates to a solution for plating the surface layer of the composite articles, which surface layer reduces insertion force and fretting corrosion of separable electronic connectors.

Growing community of inventors

Cranston, RI, United States of America

Theresa R Souza