Nortel Networks Corporation

Theodore Gregory Carron

Adrian John Bergsma

John Jackson Nisbet

Ronald Douglas Beards

Richard A Morrison

A method and system for reducing local oscillator leakage from radio frequency mixers is disclosed. Compensating circuits are used to reduce or eliminate unwanted leakage from the mixer output signal by controlling the current in individual branches of a balanced input circuit of the mixer. The current is directly controlled by adjusting the voltage on the bases of the differential type amplifier input transistors, or by injecting current directly into the individual branches, or by extracting current directly from the individual branches. The current is also indirectly controlled by increasing the temperature of the mixer components with power dissipation elements that are not connected to the mixer. The compensating circuits are made of different combinations of resistor, transistor and current sink components. By using the compensating circuits with a radio frequency mixer, any DC current differential occurring between two output nodes of the input circuit are reduced or eliminated, resulting in high quality signal transmissions.

Method to reduce local oscillator or carrier leakage in frequency converting mixers

An electronic test system used for scan testing of a device under test (DUT) is disclosed that includes a standard Automatic Test Equipment (ATE) tester and an additional test vector source apparatus called a Scanbox. The Scanbox enhances the scan pattern vector depth of any ATE system without requiring significant modifications to either its software or hardware. The Scanbox consists of a memory, an address counter, compare logic, control logic, and interface circuits. The scan vector data for the test data in (TDI) and expected test data out (ETDO) signals are stored within the Scanbox. These TDI signals are sent to the DUT during the test mode of operation while the tester provides the DUT with the test clock (TCLK), test mode select (TMS), and RESET signals. The tester further provides the Scanbox with BOXCLOCK and BOXRESET signals and the Scanbox provides the tester with a BOXERROR signal that is triggered high when the scan pattern vector data from the DUT does not match the corresponding ETDO signal. The tester is able to provide these clocking signals despite not necessarily having sufficient memory to perform the scan test with use of a repeat function within the tester. This allows the regular ATE system software and hardware to control the Scanbox without any significant modifications. Typical high-speed testers have very limited scan pattern vector depth. Hence, the addition of the Scanbox can enhance the capability of these testers, so that long scan test patterns can be performed. This eliminates the need for a second slow-speed tester being used exclusively for scan testing.

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Kanata, Canada

Theodore Gregory Carron