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Sunrise, FL, United States of America

Theodore C Waldron, Iii

Average Co-Inventor Count = 2.54

ph-index = 6

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 243

Theodore C Waldron, IiiKhoa D Huynh (3 patents)Theodore C Waldron, IiiKenneth W Christopher, Jr (2 patents)Theodore C Waldron, IiiVirginia M Roarabaugh (2 patents)Theodore C Waldron, IiiScott Lee Winters (1 patent)Theodore C Waldron, IiiKrishna Kishore Yellepeddy (1 patent)Theodore C Waldron, IiiPaul P Giangarra (1 patent)Theodore C Waldron, IiiJohn G Tyler (1 patent)Theodore C Waldron, IiiThomas Joseph Porcaro (1 patent)Theodore C Waldron, IiiRichard Byron Ward (1 patent)Theodore C Waldron, IiiCharles M Norcutt, Jr (1 patent)Theodore C Waldron, IiiTheodore C Waldron, Iii (6 patents)Khoa D HuynhKhoa D Huynh (6 patents)Kenneth W Christopher, JrKenneth W Christopher, Jr (6 patents)Virginia M RoarabaughVirginia M Roarabaugh (2 patents)Scott Lee WintersScott Lee Winters (97 patents)Krishna Kishore YellepeddyKrishna Kishore Yellepeddy (33 patents)Paul P GiangarraPaul P Giangarra (5 patents)John G TylerJohn G Tyler (4 patents)Thomas Joseph PorcaroThomas Joseph Porcaro (3 patents)Richard Byron WardRichard Byron Ward (2 patents)Charles M Norcutt, JrCharles M Norcutt, Jr (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. International Business Machines Corporation (5 from 164,108 patents)

2. Other (1 from 832,680 patents)


6 patents:

1. 6021425 - System and method for optimizing dispatch latency of tasks in a data

2. 5699511 - System and method for dynamically varying low level file system

3. 5428789 - Method and apparatus for optimizing user response time in a priority

4. 5386561 - Method of integrated system load control through dynamic time-slicing in

5. 5335332 - Method and system for stack memory alignment utilizing recursion

6. 5301312 - Method and system for utilizing benign fault occurrence to measure

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