Infineon Technologies Ag

Infineon Technologies Austria Ag

Thai Kee Gan

Ke Yan Tean

Ralf Otremba

Edward Fuergut

Lee Shuang Wang

Edmund Sales Cabatbat

Mohd Kahar Bajuri

Azlina Kassim

Mei Fen Hiew

Joel Feliciano Del Rosario

Mohd Afiz Hashim

Mark Pavier

Teck Sim Lee

Thomas Bemmerl

Chee Yang Ng

Sanjay Kumar Murugan

Jayaganasan Narayanasamy

Stefan Woetzel

Chee Hong Lee

Mohd Hasrul Zulkifli

Jo Ean Joanna Chye

Kean Ming Koe

A semiconductor package includes: a semiconductor die attached to a leadframe and having a first bond pad at a side of the semiconductor die facing away from the leadframe; a metal clip having a first bonding region attached to the first bond pad of the semiconductor die by a plurality of first wire bonds which extend through a plurality of first openings in the first bonding region of the metal clip, the plurality of first wire bonds forming a joint between the metal clip and the first bond pad of the semiconductor die; and a joint between the plurality of first wire bonds and the metal clip at a side of the metal clip facing away from the semiconductor die. Additional semiconductor package embodiments and related methods of manufacture are also described.

Semiconductor package with wire bond joints

A chip package including a semiconductor chip is provided. The chip package may include a packaging material at least partially around the semiconductor chip with an opening extending from a top surface of the packaging material to the semiconductor chip and/or to an electrical contact structure contacting the semiconductor chip, and a thermally conductive material in the opening, wherein the thermally conductive material is configured to transfer heat from the semiconductor chip to an outside, wherein the thermally conductive material extends laterally at least partially over the top surface of the packaging material.

Chip package and semiconductor arrangement having thermally conductive material in contact with a semiconductor chip and methods of forming thereof

An interconnect clip includes a die attach pad that comp includes rises a die attach surface at an inner side of the interconnect clip, a heat dissipation pad that includes a heat dissipation surface at an outer side of the interconnect clip, and a lead contact pad that includes a lead contact surface at an inner side of the interconnect clip or at an outer side of the interconnect clip. The outer side of the interconnect clip in the lead contact pad faces and is spaced apart from the inner side of the interconnect clip in the heat dissipation pad, and the inner side of the interconnect clip in the lead contact pad faces and is spaced apart from the outer side of the interconnect clip in the die attach pad.

Three level interconnect clip

A semiconductor package includes: a carrier having an electrically insulative body and a first contact structure at a first side of the electrically insulative body; and a semiconductor die having a first pad attached to the first contact structure of the carrier, the first pad being at source or emitter potential. The first pad is spaced inward from an edge of the semiconductor die by a first distance. The semiconductor die has an edge termination region between the edge and the first pad. The first contact structure of the carrier is spaced inward from the edge of the semiconductor die by a second distance greater than the first distance such that an electric field that emanates from the edge termination region in a direction of the carrier during normal operation of the semiconductor die does not reach the first contact structure of the carrier. Methods of production are also provided.

Semiconductor package having a chip carrier with a pad offset feature

A method of attaching a metal clip to a semiconductor die includes: aligning a first bonding region of the metal clip with a first bond pad of the semiconductor die; and while the first bonding region of the metal clip is aligned with the first bond pad of the semiconductor die, forming a plurality of first wire bonds to the first bond pad of the semiconductor die through a plurality of openings in the first bonding region of the metal clip, the plurality of first wire bonds forming a joint between the metal clip and the first bond pad of the semiconductor die. Additional methods and related semiconductor packages produced from such methods are also described.

Semiconductor package with wire bond joints and related methods of manufacturing

A semiconductor package includes a die pad, a semiconductor die mounted on the die pad and comprising a first terminal facing away from the die pad and a second terminal facing and electrically connected to the die pad, an interconnect clip electrically connected to the first terminal, an encapsulant body of electrically insulating material that encapsulates the semiconductor die and the interconnect clip, and a first opening in the encapsulant body that exposes a surface of the interconnect clip, the encapsulant body comprises a lower surface, an upper surface opposite from the lower surface, and a first outer edge side extending between the lower surface and the upper surface, and the first opening is laterally offset from the first outer edge side.

High voltage semiconductor package with pin fit leads

A semiconductor package includes a die pad, a die, a first lead, a plurality of second leads, and a mold material. The die is electrically coupled to the die pad. The first lead is electrically coupled to the die. The plurality of second leads are electrically coupled to the die. The plurality of second leads are adjacent to the first lead. The mold material encapsulates at least a portion of the die pad, the die, the first lead, and the plurality of second leads. Each of the plurality of second leads extends a farther distance from the mold material than the first lead.

Semiconductor package including leads of different lengths

A lead frame includes a die pad, a row of two or more leads that extend away from a first side of the die pad, and a peripheral structure disposed opposite the die pad and connected to each lead. A first outermost lead is continuously connected to the die pad. A second outermost lead has an interior end that faces and is spaced apart from the die pad. A width of the second lead in a central span of the second lead is greater than the width of the second lead in interior and outer spans of the second lead, the interior span of the second lead separating the central span of the second lead from the interior end of the second lead, the outer span of the second lead separating the central span of the second lead from the peripheral structure.

Package and lead frame design for enhanced creepage and clearance

A semiconductor package includes a die pad having a die attach surface, a rear surface opposite the die attach surface, and an outer edge side extending between the die attach surface and the rear surface, the outer edge side having a step-shaped profile, wherein an upper section of the die pad laterally overhangs past a lower section of the die pad, a semiconductor die mounted on the die attach surface and having a first electrical terminal on an upper surface of the semiconductor die, and a first conductive clip that directly electrically contacts the first electrical terminal and wraps around the outer edge side of the die pad such that a section of the first conductive clip is at least partially within an area that is directly below the upper section of the die pad and directly laterally adjacent to the lower section.

Semiconductor package with space efficient lead and die pad design

A lead frame includes a die pad having a surface, a first lead post, a first lead, a second lead post, and a second lead. The first lead post has a surface coplanar with the surface of the die pad and is in a first plane. The first lead is coupled to the first lead post. The second lead post is in a second plane different from the first plane. The second lead is coupled to the second lead post.

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Melaka, Malaysia

Thai Kee Gan