Brother Kogyo Kabushiki-Kaisha

Tetsuya Saso

Kenta Horade

Tsuyoshi Ito

Kohei Terada

Yusuke Arai

An electronic device is configured to acquire image data containing a test pattern including first and second patterns intersecting with each other. Pixels corresponding to the test pattern are determined by comparing brightness of each pixel with a threshold value, and widths of an overlapped image of the first and second patterns in an orthogonal direction at a plurality of different positions in the reference direction are calculated. Intersecting positions of the first pattern and the second pattern in the test pattern is detected based on a distribution of widths at the plurality of different positions. The test pattern has a model pattern having a set width in the orthogonal direction separate from the first and second patterns. The pixels corresponding to the test pattern are determined based on a threshold value, and widths at the plurality of positions of the overlapped image in the reference direction are calculated.

Electronic device using test pattern, method of analyzing test pattern, and non-transitory recording medium storing instructions to analyze test pattern

Growing community of inventors

Aichi, Japan

Tetsuya Saso