Shimadzu Corporation

Honda Motor Co., Ltd.

Tetsuya Nagai

Ryoji Hiraoka

Isao Azumagakito

Satoru Okada

Nobuyuki Iwai

Yasuyuki Furukawa

Mitsuru Kowada

Zeno Yonezawa

A mode of a spectrometer according to the present invention includes a spectrum measurement unit () configured to repeatedly measure a spectrum over a predetermined wavelength range for measurement target light that is laser light; a peak counting unit () configured to, every time a spectrum is obtained by the spectrum measurement unit, detect a peak from the spectrum and count the number of detected peaks; and a display processing unit () configured to display a numerical value of a peak counting result by the peak counting unit on a screen of a display unit in real time. With the spectrometer of the above mode, adjustment and the like of the multimode laser oscillator can be efficiently and accurately performed.

Spectrometer

Provided are a refractive index measuring device and a refractive index measuring method. A detector () detects an intensity of a measuring beam transmitted through the sample. A camera () images a color image of the measuring beam which is dispersed into multiple colors by transmitting through the sample. A scanning processing portion () carries out scanning by changing an angle of receiving the measuring beam transmitted through the sample or an angle of the measuring beam incident on the sample. A wavelength specifying processing portion () specifies, based on the detected intensity of the detector () varying with the scanning by the scanning processing portion () and color information corresponding to a position of the measuring beam incident on the detector () in a color image which is imaged by the camera (), the wavelength corresponding to each peak of the detected intensity.

Refractive index measuring device and refractive index measuring method

A first data acquisition processing unit acquires light intensity distribution data on the basis of an image of measurement light that has entered a camera. A second data acquisition processing unit acquires light intensity distribution data on the basis of the detected intensity of measurement light detected by a detector. A refractive index measurement processing unit measures the refractive index of a sample on the basis of the light intensity distribution data acquired by the second data acquisition processing unit. A determination processing unit determines whether the refractive index of the sample measured by the refractive index measurement processing unit is acceptable on the basis of the peaks of the light intensity distribution data acquired by the first data acquisition processing unit and second data acquisition processing unit.

V-block refractometer

Provided are an attachment for liquid sample measurement which is capable of effectively reducing a consumption amount of a liquid sample, a refractive index measuring device and a refractive index measuring method. An attachment () is disposed on a V-block prism () formed on a V-shaped groove () for keeping a sample so as to enter the groove (). A body () of the attachment () forms an enclosing space () for enclosing the liquid sample between the body and a surface of the groove () formed on the V-block prism (), and makes the liquid sample enclosed in the enclosing space () contact directly with the surface of the groove ().

Attachment for liquid sample measurement, refractive index measuring device and refractive index measuring method

Light from a direction (D) different from a predetermined direction is reflected by a tapered surface () so as to enter an optical fiber () for guiding light entering along the predetermined direction to an appliance. Light from the desired direction (D) may thereby be reflected by the tapered surface () according to the angle of the tapered surface () and may be made to enter the optical fiber (). Accordingly, even in a case where the installation position of an optical measurement probe () is limited, if the angle of the tapered surface () is appropriately set, light from the desired direction (D) may be made to enter the optical fiber ().

Optical measurement probe and optical measurement device provided with the same having a light guide with a reflection surface for reflecting light and causing light to enter the light guide

There are provided a plug built-in type optical measurement probe capable of obtaining a more accurate measurement value, and an optical measurement device provided with the same. A spark section and a light receiving section are held by a plug main body while being arranged next to each other in a protruding manner such that an end face of a holder is arranged at a position where discharge light from the spark section does not enter the field of view of the light receiving section. Accordingly, the light receiving section can be held in a manner protruding from the plug main body, and entering of the discharge light from the spark section can be restricted by the holder of the light receiving section. That is, by arranging the end face of the holder at a position where the discharge light from the spark section does not enter the field of view of the light receiving section, the light receiving intensity of the discharge light from the spark section can be prevented from being added to a measurement value, and it is possible to measure only the light generated at the time of combustion, and thus, a more accurate measurement value can be obtained.

Plug built-in type optical measurement probe, and optical measurement device provided with the same

There are provided an optical measurement probe capable of obtaining a more stable measurement result, and an optical measurement device provided with the same. An incidence surface of an optical window to be used in a high temperature environment is covered by a deposited film. The optical window is formed of sapphire, and the deposited film is formed from SiO. Adhesion of dirt to the incidence surface, and an influence, on a measurement result, of the adhesion of dirt on the incidence surface can thereby be prevented, and a more stable measurement result can be obtained.

Growing community of inventors

Nishinomiya, Japan

Tetsuya Nagai