Adv Antest Corporation

Tetsuya Koishi

Noboru Akiyama

Takeshi Yaguchi

Yasuto Kumai

Tadashi Morita

Provided is a test apparatus for testing at least one device under test, including: a test module that includes a plurality of test sections, the plurality of test sections testing the device under test by exchanging signals with the device under test; and a plurality of test control sections that control the plurality of test sections, where the test module includes the plurality of test sections; a setting storage section that stores setting as to which of the plurality of test control sections should be associated with each of the plurality of test sections; and an interface section that is connected to the plurality of test sections, provides an access request issued from one of the plurality of test control sections and directed to the test module, to a test section associated with the test control section, and is able to set, independently for each of the plurality of test sections, which of the plurality of test control sections should control the test section.

Test apparatus and test module

Provided is a test apparatus that tests a device under test, including a test head that generates a test signal for testing the device under test; a socket board onto which is mounted the device under test, that transmits signals between the test head and the device under test; a plurality of actuators that are disposed on a lower surface of the socket board to correspond one-to-one with support positions thereof, and that each have a state thereof changed according to a control signal supplied thereto to independently move the corresponding support position in a direction vertical to the lower surface of the socket board; and a connection control section that supplies a first control signal to each actuator to set each actuator to be in the same state, and thereafter supplies commonly to each actuator a second control signal that gradually decreases an apparatus separation distance between the socket board and the test head.

Test apparatus that tests a device under test and connecting apparatus that connects a first apparatus and a second apparatus

An automatic pattern synchronizing circuit re-times the phase differences between clocks, thereby adjusting test pattern outputs from a device under test. The automatic pattern synchronizing circuit includes a reference voltage generator for providing a threshold voltage, a comparator for converting an input signal into a rectangular signal, a flip-flop, a pattern-counter part for counting a signal from the flip-flop and a control part for setting the threshold voltage in the comparator. The automatic pattern synchronizing circuit automatically synchronizes voltage patterns. In particular, the high and low voltage levels of the input waveform are automatically measured and the optimum threshold voltage is automatically set.

Growing community of inventors

Gunma, Japan

Tetsuya Koishi