National Institute of Advanced Industrial Science and Technology

Other

Tetsuya Baba

Naoyuki Taketoshi

Kimihito Hatori

Hiromichi Watanabe

Tetsuya Otsuki

The present invention provides a method for measuring thermophysical properties that includes: rapid resistive self-heating of a specimen by using a heating current; emitting a light to the specimen heated by the rapid resistive self-heating of the specimen; measuring a temperature change of the specimen induced by emitting the light to the specimen; and deriving a thermal diffusivity of the specimen from the temperature change induced by emitting the light to the specimen.

Method and apparatus for measuring thermophysical properties

A measuring method eliminates the limitation of the observation time scale controlled of the optical path length, and expands the range of samples of the thermoreflectance method using a pulse laser. The method irradiates an extremely fast light pulse to a sample as a pump light pulse to excite the sample and a probe light pulse to the sample, and observes the temperature variation of the sample by detecting a reflected light from the sample. The method prepares for electrically controllable two pulse lasers: one for exciting the sample, another one for probing, separately. By electrically controlling the difference between the time at which the exciting light irradiates the sample and the time at which the probing light irradiates the sample, the method detects a signal that varies depending on the time difference between the pump pulse and the probe pulse.

Method of measuring fast time response using fast pulse and system of the same

An apparatus and method for measuring thermophysical property value of a specimen. The apparatus includes a heating laser and probe laser for measuring at least one characteristic on the surface of the specimen. A detector detects the reflected probe laser beam, and a computer calculates the thermophysical property value of the specimen based on the reflected probe laser beam.

A non-metal film whose thermophysical properties are unknown is disposed between a first metal film and a second metal film, thereby forming a sample having a three-layer structure. The metal films have predetermined known thermophysical properties, belong to the same sort of substance and have the same thickness. The three-layer substance is disposed on a transparent substrate and is heated from below the second metal film, using a picosecond light pulse coming from below and passing through the transparent substrate. The light pulse used in the irradiation is converted into heat in the second metal film during only one picosecond, with such heat diffusing through interface/non-metal film layer/interface and thus arriving at the first metal film. By measuring a temperature change on the surface of the first metal film, it is possible to perform correct measurement by using the thermoreflectance method formerly suggested in a patent application by the inventors of the present invention.

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Ibaraki, Japan

Tetsuya Baba