Asterion, Inc.

Bini Ate LLC

Tetsuro Nakao

Barry Edward Blancha

William F Kappauf

A waveform generation and measurement module that may be used in automated test equipment. The waveform generation and measurement module includes high speed SERDES (or other shift registers) that are used to digitally draw a test waveform. Additional high speed SERDES may also be used to receive (in serial form) a response waveform from a device under test and convert it to parallel data for high speed processing. The waveform generation and measurement module may be implemented in field programmable gate array logic.

Growing community of inventors

Kagoshima, Japan

Tetsuro Nakao