Tdk Corporation

Tetsuo Takaishi

Tomoaki Nonaka

Tsutomu Odashima

Hiroshi Sasaki

Masaki Sobu

Kenta Iwasawa

Takahiro Harada

Atsushi Sano

Yasuhiro Ikeda

Hiroki Kitamura

Matsumi Watanabe

Shinsuke Hashimoto

Hiroyuki Miyabara

Yukiko Hirabayashi

A lithium ion secondary battery with a high electrode density and an excellent rate discharge characteristic. The positive electrode includes a positive electrode active material of a compound represented by Li(NiCoAl)O(0.95&#x2266;a&#x2266;1.05, 0.5&#x2266;x&#x2266;0.9, 0.05&#x2266;y&#x2266;0.2), and carbon adhered to the surface of the material, in the Raman spectrum using a laser of 532 nm, the positive electrode includes a peak P(D band) at 1200&#x2dc;1450 cm, a peak P(G band) at 1450&#x2dc;1700 cmand a peak Pat 400&#x2dc;600 cm, and when the intensities are normalized by regarding the maximum intensity as 1 and the minimum intensity as 0 in the wavenumber domain of 200&#x2dc;1800 cm, Raman intensity of the minimum (V band) between the two peaks of said peak Pand said peak Pis 0.6 or less, and Raman intensity of said peak Pis 0.1 or more and 0.5 or less.

Positive electrode and lithium ion secondary battery using thereof

A negative electrode active material mainly contains silicon and silicon oxide. In the negative electrode active material, an Ar-laser Raman spectrum thereof includes a peak A corresponding to 950&#xb1;30 cmand a peak B corresponding to 480&#xb1;30 cm, and an intensity ratio of the peak B to the peak A (B/A) is in the range of 1 to 10.

Negative electrode active material, electrode containing the same, and lithium ion secondary battery having the electrode

The present invention relates to a dielectric ceramic composition comprises a main component including a dielectric oxide having a composition shown by [(CaSr)O][(ZrTiHfMn)O], note that, 0.991&#x2266;m&#x2266;1.010, 0&#x2266;x&#x2266;1, 0&#x2266;y&#x2266;0.1, 0&#x3c;z&#x2266;0.02, 0.002&#x3c;&#x3b1;&#x2266;0.05), 0.1 to 0.5 parts by mol of AlOand 0.5 to 5.0 parts by mol of SiOwith respect to 100 parts by mol of the main component. A purpose of the present invention is to provide a dielectric ceramic composition available to prevent the occurrence of crack even when a dielectric layer is made thin, for example, 2 &#x3bc;m or less, while maintaining various advantageous properties of a dielectric ceramic composition of [(CaSr)O][(TiZrHf)O] type.

Dielectric ceramic composition, an electric component and a manufacturing method thereof

The object of the present invention is to provide a method of production of dielectric ceramic composition which can lower the firing temperature without compensating the dielectric characteristics. The method of production according to the present invention is characterized by comprising steps of;

Dielectric ceramic composition and method of production thereof

A production method of a dielectric ceramic composition at least including a main component including a dielectric oxide having perovskite-type crystal structure expressed by a formula ABO(note that in the formula, 'A' indicates one or more elements selected from Ba, Ca, Sr and Mg, and that 'B' indicates one or more elements selected from Ti, Zr and Hf) comprises steps of preparing a main component material including said dielectric oxide expressed by ABO; preparing a subcomponent material including a composite oxide expressed by MRO(SiO)(note that &#x201c;M&#x201d; indicates at least one selected from Ca and Sr, and that &#x201c;R&#x201d; indicates at least one selected from Sc, Y, La, Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb and Lu); mixing said main component material and subcomponent material to obtain a dielectric ceramic composition material; and firing said dielectric ceramic composition material.

Production method of dielectric ceramic composition and production method of electronic device

A dielectric ceramic composition comprising 100 moles of barium titanate as the main component, and furthermore comprising with respect to 100 moles of the main component 0.1 to 3 moles of a first subcomponent including a magnesium oxide, 0.01 to 0.5 mole (note that 0.5 is not included) of a second subcomponent including a yttrium oxide, 0.01 to 0.2 mole of a third subcomponent including a vanadium oxide, and 0.5 to 10 moles of a glass component including a silicon oxide as the main component; wherein a manganese oxide and a chrome oxide are substantially not included, and an average particle diameter of dielectric particles is 0.35 &#x3bc;m or smaller.

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Tokyo, Japan

Tetsuo Takaishi