Takeda Riken Kogyo Kabushiki Kaisha

Takeda Riken Co., Ltd.

Takeda Riker Co. Ltd.

Tetsuo Aoki

Takayuki Nakajima

Noboru Akiyama

Katsumi Kobayashi

Koji Nakagomi

A logic analyzer applies test pattern signals from a pattern generator to a circuit under test and sequentially reads logic outputs into a memory. The output from the circuit under test when it reaches a predetermined logic state is input as an external control signal into the logic analyzer. A change command is generated from the pattern generator in relation to the generation of the test pattern signal. When the change command and the external control signal are obtained at the same time, and flow of the generation of the test pattern signals is changed to a predetermined flow.

Logic analyzer

Logic output data of a plurality of channels simultaneously obtained from a circuit under test are sequentially input in a memory, and after inputting a predetermined amount of such data, they are compared with corresponding expected values. The input data are divided into blocks, each including a plurality of data. Whether a mismatch is present in the comparison results for each block is indicated by a respective block element, and such block elements are displayed in a predetermined arrangement. It is also possible to provide a conventional list display including the input timing corresponding to the comparison results in which a mismatch is present.

A device for recognizing and measuring the lengths of glitches by sampling the input signal at fractions of a sampling clock, which clock has a period shorter than the period of pulses of the correct signal but longer than the glitch widths. The corrected input signal can be displayed, along with the glitch information.

Glitch detecting and measuring apparatus

Control side equipment and at least one equipment under control are commonly interconnected via a data line and a strobe line. The equipment under control is provided with means for retaining the logic of a strobe pulse when it is received from a strobe line. When the control side equipment has set data on the data line and provided the strobe pulse on the strobe line, the logic hold means of the equipment under control holds the logic of the strobe pulse and the data set on the data line is fetched therefrom into the equipment. Thereafter, the logic hold is released to thereby inform the control side equipment that the equipment under control is ready for receiving the next data. The control side equipment monitors the strobe line and, upon detection of the information, sets new data on the data line and sends out a strobe pulse. Thereafter, similar operations are carried out, by which data are sequentially transferred from the control side equipment to the equipment under control. In the case of transferring data from the equipment under control to the control side equipment, when the control side equipment sends out a strobe pulse representing that it is ready for receiving data, the logic hold means of the equipment under control holds the logic of the strobe pulse, data is set on the data line and then the logic hold is released, by which the control side equipment is informed that the data to be transferred has been set. Upon detection of releasing of the logic hold by monitoring the strobe line, the control side equipment fetches the data from the data line and when it has become ready for receiving the next data, it sends out a strobe pulse again, thus, fetching data one after another.

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Kohnosu, Japan

Tetsuo Aoki