Ebara Corporation

Kabushiki Kaisha Toshiba

Other

Tetsuji Togawa

Osamu Nabeya

Makoto Fukushima

Kunihiko Sakurai

Nobuyuki Takada

Hozumi Yasuda

Toyomi Nishi

Masaya Seki

Kuniaki Yamaguchi

Satoshi Wakabayashi

Kenya Ito

Kenichiro Saito

Shunichiro Kojima

Hiroshi Yoshida

Seiji Katsuoka

Masayuki Nakanishi

Hiromi Yajima

Tomoshi Inoue

Hirokuni Hiyama

Manabu Tsujimura

Keisuke Namiki

Kazuto Hirokawa

Atsushi Yoshida

Koichi Fukaya

Shoichi Kodama

Kenichi Kobayashi

Ikutaro Noji

Riichiro Aoki

Kenji Iwade

Yukio Imoto

Norio Kimura

Yu Ishii

Masahiko Sekimoto

Takuji Hayama

Hideki Takayanagi

Daisuke Koga

Hisanori Matsuo

Atsushi Shigeta

Yutaka Wada

Shiro Mishima

Harumitsu Saito

Gisuke Kouno

Teruhiko Ichimura

Kazuaki Himukai

Masako Watase

Hiroyuki Yano

Koji Saito

Koji Mishima

Akira Tanaka

Hiroaki Inoue

Shingo Togashi

Toshio Watanabe

Yoshikuni Tateyama

Yoshihiro Mochizuki

Yoko Suzuki

Takeo Kubota

Akira Fukuda

Fumio Kondo

Gen Toyota

Ritsuo Kikuta

Hiroyuki Takenaka

Masahiro Hatakeyama

Taro Takahashi

Satoru Yamaki

Toshifumi Watanabe

Makoto Kashiwagi

Naoki Matsuda

Hiroshi Sobukawa

Mitsuo Tada

Takeshi Sakurai

Kenichi Akazawa

Keisuke Uchiyama

Hidetaka Nakao

Yasunari Suto

Shingo Saito

Takashi Omichi

Miki Shibata

Koji Ono

Tamami Takahashi

Masako Kodera

Hiroo Suzuki

Hiroshi Sotozaki

Ryuichi Kosuge

Takeshi Nishioka

Takashi Mitsuya

Asagi Matsugu

Akihiro Yazawa

Kenichi Shigeta

Hiroyuki Osawa

Takahiro Nanjo

Koji Ato

Hideharu Aoyama

Fong-Jie Du

Michiyoshi Yamashita

Kimihide Nagata

Robert R Jackson

Takashi Koba

To provide an automated apparatus for conveying a rectangular substrate. According to one embodiment, there is provided a substrate conveying apparatus for conveying the rectangular substrate. The substrate conveying apparatus includes a plurality of conveyance rollers, a plurality of roller shafts, a motor, and a pusher. The plurality of conveyance rollers are configured to support a lower surface of the substrate. To the plurality of roller shafts, the plurality of conveyance rollers are mounted. The motor is configured to rotate the plurality of roller shafts. The pusher is for lifting the substrate on the plurality of conveyance rollers such that the substrate is separated away from the plurality of conveyance rollers. The pusher includes a stage configured to pass through a clearance between the plurality of roller shafts.

Substrate transporter and substrate processing apparatus including substrate transporter

In a substrate polishing apparatus where a polishing liquid passes through inside a rotary joint, the rotary joint requires maintenance. There is provided a substrate polishing apparatus that includes: a polishing head for holding a substrate; a rotary table that has a surface to which a first opening portion is provided; a polishing liquid discharge mechanism disposed to the rotary table; and a controller configured to control at least the polishing liquid discharge mechanism. The polishing liquid discharge mechanism includes a first cylinder, a first piston, and a driving mechanism that drives the first piston. The first opening portion is communicated with a liquid holding space defined by the first cylinder and the first piston. The controller controls the driving of the first piston by the driving mechanism to increase and decrease a volume of the liquid holding space.

Substrate polishing apparatus and polishing liquid discharge method in substrate polishing apparatus

A polishing method capable of accurately determining a polishing end point of a substrate is disclosed. The method comprises: rotating a polishing table supporting a polishing pad; and polishing the substrate by pressing the substrate against a polishing surface of the polishing pad by a polishing head, wherein polishing the substrate includes: an oscillation polishing process of polishing the substrate while causing the polishing head to oscillate along the polishing surface; and a static polishing process of polishing the substrate with the oscillation of the polishing head stopped, the static polishing process is performed after the oscillation polishing process, and the static polishing process comprises determining a static polishing end point which is a point in time at which a rate of change of torque for rotating the polishing table has reached a change-rate threshold value.

Polishing method and polishing apparatus

A CMP polishing apparatus for flattening a quadrate substrate is provided. A polishing apparatus for polishing a quadrate substrate is provided. The polishing apparatus includes a substrate holding portion configured to hold the quadrate substrate. The substrate holding portion includes a quadrate substrate supporting surface that supports the substrate, and an attachment mechanism that attaches a retainer member to be disposed at an outside of at least one corner portion of the substrate supporting surface.

Polishing apparatus of substrate

To terminate polishing at an appropriate position, an end point position of the polishing is sensed. According to one embodiment, a method that chemomechanically polishes a substrate including a functional chip is provided. The method includes: a step of disposing the functional chip on the substrate; a step of disposing an end point sensing element on the substrate; a step of sealing the substrate on which the functional chip and the end point sensing element are disposed with an insulating material; a step of polishing the insulating material; and a step of sensing an end point of the polishing based on the end point sensing element while the insulating material is polished.

Method for polishing substrate including functional chip

A polishing method is used for polishing a substrate such as a semiconductor wafer to a flat mirror finish. A method of polishing a substrate by a polishing apparatus includes a polishing table () having a polishing surface, a top ring () for holding a substrate and pressing the substrate against the polishing surface, and a vertically movable mechanism () for moving the top ring () in a vertical direction. The top ring () is moved to a first height before the substrate is pressed against the polishing surface, and then the top ring () is moved to a second height after the substrate is pressed against the polishing surface.

Method and apparatus for polishing a substrate

Disclosed is a polishing head for a polishing apparatus for polishing a quadrangular substrate using a polishing pad attached to a polishing table, comprising a head body portion, a plurality of elastic bags disposed in a surface of the head body portion, which is to face the polishing table, and a substrate holding plate for holding the substrate, the substrate holding plate being pressed by the elastic bags in a direction away from the head body portion, the head body portion being provided with channels for bags, which are in communication with the respective elastic bags, the polishing head further including at least two support plates disposed between the elastic bags on one hand and the substrate holding plate on the other, the elastic bags being configured to press the substrate holding plate through the support plates.

Polishing head and polishing apparatus

A polishing liquid is supplied without passing through a rotary joint in a face-up type polishing apparatus. This application discloses a polishing head for the face-up type polishing apparatus used by mounting a polishing pad on a lower surface as one embodiment. The polishing head includes a liquid reservoir portion that receives a liquid and a liquid discharge port that discharges the liquid received by the liquid reservoir portion. The liquid reservoir portion is disposed around a rotation axis of the polishing head. The liquid discharge port is disposed on the lower surface of the polishing head. An annular opening centering on the rotation axis of the polishing head is formed on an upper portion of the polishing head. The liquid reservoir portion is communicated with a space outside the polishing head via the opening.

Polishing head for face-up type polishing apparatus, polishing apparatus including the polishing head, and polishing method using the polishing apparatus

A substrate processing apparatus which can remove foreign matters attached to the entire upper surface of a substrate such as a wafer is disclosed. The substrate processing apparatus includes: a substrate holding apparatus; and a processing head configured to scrub an upper surface of a substrate. The substrate holding apparatus includes: a substrate holder configured to hold the substrate; and a substrate rotating mechanism configured to rotate the substrate held by the substrate holder. The substrate holder is disposed below the upper surface of the substrate so as not to project above the upper surface of the substrate in a state where the substrate is held by the substrate holder.

Substrate processing apparatus and substrate holding apparatus

A polishing apparatus has a polishing pad, a top ring for holding a semiconductor wafer, and a vertical movement mechanism operable to move the top ring in a vertical direction. The polishing apparatus also has a distance measuring sensor operable to detect a position of the top ring when a lower surface of the top ring is brought into contact with the polishing pad, and a controller operable to calculate an optimal position of the top ring to polish the semiconductor wafer based on the position detected by the distance measuring sensor. The vertical movement mechanism includes a ball screw mechanism operable to move the top ring to the optimal position.

Polishing apparatus

The polishing apparatus has a polishing unit capable of polishing a peripheral portion of the substrate to form a right-angled cross section. The polishing apparatus includes: a substrate holder that holds and rotates the substrate; guide rollers that support a polishing tape; and a polishing head having a pressing member that presses an edge of the polishing tape against the peripheral portion of the substrate from above. The guide rollers are arranged such that the polishing tape extends parallel to a tangential direction of the substrate and a polishing surface of the polishing tape is parallel to a surface of the substrate. The substrate holder includes: a holding stage that holds the substrate; and a supporting stage that supports a lower surface of the peripheral portion of the substrate in its entirety. The supporting stage rotates in unison with the holding stage.

Polishing apparatus and polishing method

An apparatus for detecting an abnormality in polishing of an edge portion of a substrate is provided. The apparatus includes: a substrate holder configured to rotate the substrate; a pressing device configured to press a polishing tool against the edge portion of the substrate to polish the edge portion; a measuring device configured to measure a position of the polishing tool relative to a surface of the substrate; and a controller configured to determine an amount of polishing of the substrate from the position of the polishing tool, calculate a polishing rate from the amount of polishing of the substrate, and judge that an abnormality in polishing of the edge portion of the substrate has occurred if the polishing rate is out of a predetermined range.

Polishing apparatus for detecting abnormality in polishing of a substrate

Growing community of inventors

Tokyo, Japan

Tetsuji Togawa