Jasco Corporation

Tetsuji Sunami

Jun Koshobu

Keisuke Watanabe

Jun Koshoubu

Hiroshi Sugiyama

Kenichi Akao

Takashi Shimamura

Noriaki Soga

Tsubasa Asatsuma

Norio Wakimoto

An ATR optical instrument condensing an infrared light to a sample-side surface of a ATR crystal to measure a total reflection absorption spectrum includes: an incident-side ellipsoidal mirror condensing the infrared light to the sample-side surface at an incident angle equal to or larger than a critical angle &#x3b8;c inside; an exiting-side ellipsoidal mirror condensing a total reflection light from the sample-side surface; dichroic mirrors guiding an illumination light coaxially to the ellipsoidal mirrors; and a ZnS lens condensing a visible light from the sample-side surface to observe a contact state of the sample. The dichroic mirrors are configured to guide the illumination light to the ellipsoidal mirrors such that the illumination light is condensed to the sample-side surface at an angle less that a critical angle &#x3b8;c' of the visible light. Accordingly, the ATR optical instrument becomes compact, and can visually observe the contact state of the sample surface.

Optical instrument for measuring total reflection absorption spectrum and measuring device

A method for measuring spectrum by Fourier-transforming an interferogram of an infrared interference wave acquired with an interferometer, including a step of over-sampling intensity signals of the interference wave at positions (D1, D2, . . . ) of a movable mirror set on the basis of a wavelength &#x3bb;1 of a semi-conductor laser, and a step of interpolating intensity signals (I1', I2&#x2032;, . . . ) that would be obtained when the interference wave is sampled at positions (D1&#x2032;, D2&#x2032;, . . . ) of the movable mirror set on the basis of a wavelength &#x3bb;0 of a He&#x2014;Ne laser, by using the over-sampled intensity signals (I1, I2, . . . ), for calculating the spectrum with the interferogram based on the interpolated intensity signals (I1&#x2032;, I2&#x2032;, . . . ) and for an efficient use of conventional stored spectrum data which are measured based on the wavelength &#x3bb;0.

Spectrum measurement method using fourier transform type spectroscopic device

A depolarizer includes a pair of wedge-shaped plates made of an optically isotropic material, laid one on top of another such that the total thickness is constant and wedge-plate holding means for holding the pair of wedge plates separately. The wedge-plate holding means includes a pressure-applying section for applying pressure to each of the pair of wedge plates in a direction perpendicular to the thickness direction of the pair of wedge plates. The pressure-applying direction for one of the pair of wedge plates and the pressure-applying direction for the other of the pair of wedge plates intersect at an angle of 45 degrees.

Depolarizer and circular dichroism spectrometer using the same

A circular dichroism (CD) spectrometer includes an alignment mechanism that automatically adjusts the elements thereof at appropriate positions. The spectrometer has a focusing-lens position-and-orientation adjustment mechanism which adjusts the position and the orientation of the detector-side focusing lens. It also has a detector rotation mechanism which adjusts the orientation of the detector. Firstly, a control PC monitors the CD spectrum of D form of optical enantiomers, and the adjustment mechanism adjusts the focusing lens such that the monitored CD spectrum matches the reference spectrum related to the D form. Next, the control PC moniters CD spectrum of L form of optical enantiomers, and the adjustment mechanism adjusts the focusing lens such that the monitored CD spectrum of the D and L forms become symmetrical. And, the rotation mechanism adjusts the orientation of the detector such that the intensity of the detector signal is maximized.

Circular dichroism spectrometer having alignment mechanism

A noise-component removing method for removing a noise component from multipoint spectral data that has been generated through measurements performed at measurement points of a sample surface, the method comprising: a PLS analysis step of determining components of the multipoint spectral data for each measurement point in a descending order of eigenvalues of the components by subjecting the multipoint spectral data to multivariate analysis based on the partial least squares regression using a value obtained by quantifying characteristic information about a characteristic of each measurement point, other than spectral information of the measurement point and using the spectral information as an independent variable in the partial least squares regression; and a spectrum reconstruction step of reconstructing the multipoint spectral data for each measurement point to eliminate a component having an eigenvalue lower than a predetermined value, from the components determined in the PLS analysis step.

Growing community of inventors

Hachioji, Japan

Tetsuji Sunami