Arkray, Inc.

Tetsuaki Saiji

Junichi Oka

Yukio Higashiisogawa

The present invention relates to an analyzing device provided with: a light-measuring mechanism () that includes a light-emitting unit for emitting light onto a test tool () to analyze a sample and a light-receiving unit for receiving reflection light from the test tool (); and a detecting mechanism () for detecting whether or not the test tool exists in a target area, the mechanism including a light-emitting unit for emitting light onto the test tool () and a light-receiving unit for receiving reflection light from the test tool (). In the light-measuring mechanism (), the light-emitting unit and light-receiving unit are disposed such that the light emission axis of the light-emitting unit and the light reception axis of the light-receiving unit are parallel or substantially parallel to each other. The detecting mechanism () is arranged such that the one or more light-receiving units selectively receive regularly-reflected light from the test tool () among the light emitted from the light-emitting unit.

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Kyoto, Japan

Tetsuaki Saiji