Adv Antest Corporation

Tetsu Katagiri

Masaru Tsuto

Masaru Goishi

Hiroyasu Nakayama

Shinichi Ishikawa

Takehisa Suzuki

Provided is a test apparatus that tests a device under test, comprising a testing section that stores a program in which commands to be executed branch according to detected branching conditions and that tests the device under test by executing the program; and a log memory that stores test results of the testing section in association with command paths of the program executed to obtain the test results. The testing section sequentially changes a characteristic of a test signal supplied to the device under test, and judges pass/fail of the device under test for each characteristic of the test signal, and the log memory stores a test result of the testing section in association with a command path of the program, for each characteristic of the test signal.

Test apparatus and test method

A recording medium recording thereon a program for a test apparatus including test modules that test devices under test is provided. The program includes: a common function provision program which is executed on a controller for controlling the test apparatus and provides a function common to each type of the test modules; and a plug-in processing program which is executed on the controller and plugs-in an individual function provision program for providing a function appropriate for the type of each of the test modules.

Growing community of inventors

Saitama, Japan

Tetsu Katagiri