Hewlett-packard Development Company, L.p.

Terry Mcmahon

Chien-Hua Chen

Andrew L Van Brocklin

Donald W Schulte

David Douglas Hall

Lawrence H White

Anthony M Fuller

Ed Friesen

Stan E Leigh

Amy Gault

Robel Vina

Sara Jensen Homeijer

Tom P Abdilla

Ying-Chih Liao

Rivas Rio

A thermal inkjet printhead is described. The thermal inkjet printhead comprising a passivation layer and a plurality of bond pads formed over the passivation layer. The thermal inkjet printhead further comprises a plurality of insulating strips formed over the passivation layer. The insulating strips are formed such that two adjacent bond pads are separated by an insulating strip, from among the plurality of insulating strips. Further, each of the plurality of the insulating strips is of a dielectric material.

Thermal inkjet printhead

An assembly for selectively etching an inkjet printhead includes a substrate and printhead layers formed on the substrate. A bonding region can provide a location on the printhead layers for an electrical bond. An ink channeling region can be defined at least in part by the printhead layers. A mask layer can partially cover the printhead layers and include a first opening positioned over the bonding region and a second opening positioned over the ink channeling region. The assembly can also include a via at the first opening and a trench at the second opening having greater depth than the via.

Assembly to selectively etch at inkjet printhead

A method of determining a healthy fluid ejection nozzle includes measuring changes in impedance across the nozzle as fluid passes through it. A printhead includes a metal probe that intersects an ink nozzle and an integrated circuit to sense a change in impedance across the nozzle through the metal probe.

Determining a healthy fluid ejection nozzle

A method of storing data in an array of circuit elements, said method comprising injecting a current into selected circuit elements, said current causing a persistent change in a resistance of said selected circuit elements from a first resistance to a second higher resistance indicative of a binary data bit, wherein said current does not break an electrical circuit in which said circuit element is disposed.

Data storage in circuit elements with changed resistance

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Albany, OR, United States of America

Terry Mcmahon