Halliburton Energy Services, Inc.

Terrell K Teague

David L Perkins

Robert Paul Freese

William Joseph Soltmann

Michael L Myrick

Leonard Zheleznyak

The present subject matter relates to methods of high-speed analysis of product samples. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward an optical detector. Signals for the detector are compared with reference signals based on a portion of the illuminating light passing through a reference element to determine characteristics of the product under analysis. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.

Multi-analyte optical computing system

An optical analysis system for measuring compositions of a sample includes a light source radiating a first light. A modulator disposed in a ray path of the light modulates the light to a desired frequency. A spectral element filters the light for a spectral range of interest of the sample. An optical filter receives a first light beam split from the light reflecting from the sample and optically filters data carried by the first light beam into at least one orthogonal component of the first light beam. A first detector measures a property of the orthogonal component. A second detector receives a second light beam split from the light reflecting from the sample for comparison of the property of the orthogonal component to the second light beam. An accelerometer senses when to acquire data from the sample.

Self-contained multivariate optical computing and analysis system

The present subject matter relates to methods of high-speed analysis of product samples. Light is directed to a portion of a product under analysis and reflected from or transmitted through the product toward a plurality of optical detectors. Signals from the detectors are compared with a reference signal based on a portion of the illuminating light passing through a reference element to determine characteristics of the product under analysis. The products under analysis may be stationary, moved by an inspection point by conveyor or other means, or may be contained within a container, the container including a window portion through which the product illuminating light may pass.

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Walworth, NY, United States of America

Terrell K Teague