Zenith Electronics Corporation

Terence J Knowles

Francis M Ray

Charles E Shewey

A high voltage electronic component test apparatus includes a test chamber containing a pair of electrodes across which a high voltage is applied and between which a component is placed in circuit by means of a movable component gripper assembly for the testing thereof. Voltage generating and electrical measurement apparatus is coupled to the electrodes for applying a high voltage thereacross and for measuring the resulting current within the electronic component. From the component testing, the remotely operated gripper assembly then removes the tested component from the test chamber and introduces another component for testing therein. A closed, circulating liquid-vapor system coupled to the test chamber introduces an electrically inert vapor, such as Freon or a fluorinated hydrocarbon, into the test chamber to prevent arcing and eliminate leakage currents therein. The dielectric vapor condenses on the cooled inner walls of the test chamber, collects as a liquid in a lower portion thereof, and flows under gravity to a reservoir where it is heated and returned to the test chamber in vapor form in a continuously circulating manner. The test apparatus of the present invention is capable of measuring currents in the nano-ampere range at kilovolt test voltages.

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Lincolnshire, IL, United States of America

Terence J Knowles