Kabushiki Kaisha Toshiba

Teppei Nakano

Keizo Tashiro

Junichi Hosokawa

Naoto Mihara

Akira Yoshino

Shiroshi Kanemitsu

Keiichiro Yanagida

Motohiro Morisaki

Yuuki Koguchi

Hidetoshi Kono

According to one embodiment, a solid-state imaging device includes an illuminance value calculating unit and an illuminance value output unit. The illuminance value calculating unit calculates an illuminance value based on an integration result of luminance values. The illuminance value output unit outputs the illuminance value calculated by the illuminance value calculating unit by setting, as a target, a subject image obtained through application of one of two or more illuminance measurement conditions. The two or more illuminance measurement conditions are set in advance by varying at least one of an electronic shutter time and an analog gain.

Solid-state imaging device, illuminance measuring method performed by solid-state imaging device, and camera module

According to one embodiment, a condition judging unit judges whether a target pixel corresponds to a defect condition based on a signal of the target pixel and a signal of a horizontal peripheral pixel. A signal substituting unit performs signal substitution on the target pixel corresponding to the defect condition. When the condition judging unit judges that at least one of a vertical peripheral pixel and an oblique peripheral pixel corresponds to the defect condition, the signal substituting unit stops the signal substitution on the target pixel.

Image processing device with defect correcting circuit and image processing method

According to one embodiment, a solid-state imaging device includes a luminance integrating unit, a luminance observation value calculating unit, and an illuminance value conversion unit. The luminance integrating unit integrates a luminance value detected for every pixel. The luminance observation value calculating unit calculates a luminance observation value based on an integration result in the luminance integrating unit. The luminance observation value is an observation result of the luminance for an entire imaging screen. The illuminance value conversion unit converts the luminance observation value to an illuminance value. The luminance integrating unit integrates the luminance value discriminated in accordance with a condition set with respect to a luminance level.

Solid-state imaging device, camera module, and illuminance detection method

According to one embodiment, a solid-state imaging device includes an output level determining unit, a random number data generating unit, and an output selecting unit. The output level determining unit performs a level determination of a digital output signal by comparing a level of the digital output signal with a threshold value. The random number data generating unit generates random number data by random number processing on the level of the digital output signal. The output selecting unit selects any of: the digital output signal subjected to an addition of the random number data, and the digital output signal not subjected to the addition of the random number data corresponding to a result of the level determination.

Solid-state imaging device, imaging method, and camera module

A solid-state image sensing device includes an image sensing region having pixels arranged in a two-dimensional array. A vertical shift register circuit selects a desired pixel row of the pixels by changing the number of one or more clock signals supplied and timing thereof in one horizontal period. A pulse selector circuit supplies a drive pulse to the desired pixel row selected by the vertical shift register circuit.

Solid-state image sensing device and control method of solid-state image sensing device

According to one embodiment, a false color mask signal generation circuit generates a false color pixel mask signal to exclude false color component pixels based on an edge component signal from an edge component extraction circuit. A white balance gain calculation circuit calculates a white balance gain from an integrated value calculated by the false color component pixels being excluded based on the false color pixel mask signal.

Image processing apparatus, camera module and electronic device

According to one embodiment, a solid-state imaging sensor includes an imaging area, a vertical selector circuit, a pulse selector circuit and a timing generator circuit. The vertical selector circuit is provided with one row address comparator circuit corresponding to each of pixel rows. The row address comparator circuit is supplied with a row address in time division within one horizontal scanning interval with respect to the imaging area. Based on the comparison result of the row address comparator circuit, the vertical selector circuit outputs an electronic shutter row select signal and a read row select signal for setting an electronic shutter state and a read state of the corresponding pixel row.

Solid-state imaging device

A shading correcting device includes a correction-coefficient interpolation unit that calculates a color shading correction coefficient used at a position of a pixel at which the color shading correction coefficient is not set among pixels in an image signal by an interpolation process using a color shading correction coefficient set at a predetermined position. A color shading correction coefficient sent to the correction-coefficient interpolation unit is a color shading correction coefficient that is for a first color and corresponds to a pixel value of a second color adjacent to a pixel of the first color.

Shading correcting device and imaging apparatus

An analog signal photo-electrically converted in a pixel of a light receiving area is converted to a digital signal by an ADC. The digital signal is processed by a digital signal processing circuit, and then, successively output as a digital video signal. The digital signal processing circuit has a first signal processing block for detecting and correcting a pixel defect and preventing a noise, and a second signal processing block for restoring apparent resolution lost by the processing by the first signal processing block.

Growing community of inventors

Kanagawa, Japan

Teppei Nakano