Sun Microsystems, Inc.

Teong Ming Cheah

Peter F Lai

Shyam Sundar

Rambabu Pyapali

Aveek Sarkar

The present application describes various embodiments of a method and an apparatus for determining electromigration risks for signal nets in integrated circuits. A model for each one of the global nets connecting various circuit blocks in an integrated circuit is created using circuit blocks' timing model and detailed standard parasitic format representation (DSPF) of each global net. The final layout of the integrated circuit is not necessary to determine the electromigration risks. The models can be generated during the early stages of the design cycle once the DSPF of the global nets is available.

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Sunnyvale, CA, United States of America

Teong Ming Cheah