Hewlett-packard Company

Ted J Lopez

Thomas M Laffey

Scott Arthur Jones

The present invention provides a test and diagnosis system for testing an embedded processor. The test system includes an ASIC having an embedded microprocessor, a debug assist logic unit for monitoring the addresses and data from the embedded microprocessor, a debug kernel and an instruction overlay harness. When the debug assist logic block finds a predetermined set of match conditions, it interrupts the embedded microprocessor and transfers control from the code running on the microprocessor to the debug kernel. The debug kernel is coupled to the debug assist logic unit and responsive to user input, the debug kernel allows the user to trace processor transactions during code execution. A REMAP bit in the ASIC allows remapping of the microprocessor memory into a faster instruction overlay memory, allowing the code to be quickly modified during product debug.

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Rocklin, CA, United States of America

Ted J Lopez